WorldCat Identities

Richter, H. 1940-

Overview
Works: 16 works in 51 publications in 2 languages and 814 library holdings
Genres: Conference papers and proceedings 
Roles: Editor
Publication Timeline
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Most widely held works by H Richter
Proceedings of the 10th International Autumn Meeting Gettering and defect engineering in semiconductor technology : GADEST 2003, Seehotel Zeuthen (suburb of Berlin), State of Brandenburg, Germany, September 21-26, 2003 by International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology"( Book )

2 editions published in 2004 in English and held by 21 WorldCat member libraries worldwide

Gettering and defect engineering in the semiconductor technology (GADEST) : proceedings : 1st international autumn school, 1985 : Garzau, October 8-18, 1985, DDR by 1985, Garzau> GADEST. <1( Book )

8 editions published in 1985 in English and Undetermined and held by 18 WorldCat member libraries worldwide

Gettering and defect engineering in the semiconductor technology (GADEST, 87) : proceedings : 2nd international autumn meeting, Garzau, October 11-17, 1987 by GADEST( Book )

9 editions published in 1987 in English and Undetermined and held by 18 WorldCat member libraries worldwide

Proceedings of the 6th Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology : GADEST '95 : held in Parkhotel Schloss Wulkow, near Berlin, Germany, September 02-07 1995 by International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology"( Book )

2 editions published in 1995 in English and held by 14 WorldCat member libraries worldwide

Gettering and defect engineering in semiconductor technology : GADEST '91 : proceedings of the 4th International Autumn Meeting held in Chossewitz, near Frankfurt (Oder), Germany October 13-19 1991 by International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology"( Book )

3 editions published in 1991 in English and held by 14 WorldCat member libraries worldwide

Gettering and defect engineering in semiconductor technology : GADEST '93 : proceedings of the 5th International Autumn Meeting held in Chossewitz, near Frankfurt (Oder), Germany October 09-14 1993 by International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology"( Book )

5 editions published in 1993 in English and held by 13 WorldCat member libraries worldwide

Silicon materials science and technology X by International Symposium on Silicon Materials Science and Technology( Book )

3 editions published in 2006 in English and held by 10 WorldCat member libraries worldwide

Ileus : [Vorträge] ... by Ileus-Symposium( Book )

1 edition published in 1978 in German and held by 9 WorldCat member libraries worldwide

Gettering and defect engineering in semiconductor technology XIII : GADEST 2009 : proceedings of the XIIIth International Autumn Meeting, Dölnsee-Schorfheide, north of Berlin, Germany, September 26-October 02, 2009 by International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology"( Book )

3 editions published in 2010 in English and held by 8 WorldCat member libraries worldwide

This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices. The volume comprises 93 contributions; among them, 14 invited papers, from more than 20 different countries. The invited papers, submitted by internationally recognized experts in the field, review the state-of-the-art and likely future trends in their respective research field. Upon comparing this volume with previous volumes, it is clearly seen that defect engineering in photovoltaics is becoming a topic of ever-increasing inte
Sub-quarter-micron silicon issues in the 200/300 mm conversion era : proceedings of the E-MRS IUMRS ICEM 2000 Meeting, Symposium L by European Materials Research Society( Book )

3 editions published in 2001 in English and held by 5 WorldCat member libraries worldwide

Research investigation on strain analysis of metal sheets with notches and cracks by G. U Oppel( Book )

4 editions published in 1962 in English and held by 4 WorldCat member libraries worldwide

The report presents experimental observations and measurements concerning the strain distribution and changes of the strain distribution at the base of semi-circular notches and at the base of cracks in thin flat metal sheets. The metal sheets were subjected to static and to fluctuating tensile loading. The photoelastic coating method and a method utilizing Newton interference fringes were used to perform the stain observations and measurements. With both methods applied to semi-circular notches, a so-called necking zone could be observed. It was found that the necking zone must have a certain magnitude before cracks are formed at the base of the notch. New details concerning the geometry and magnitude of the strain distribution and its changes were also observed at the base of cracks in thin metal sheets using the interferometric method. To the best of the author's knowledge, this is the first time that this method has been applied to strain analysis around cracks in metal. The residual and total strain distribution, for static loading, at the base of cracks were obtained thusly. Data on the rate of crack propagation and its relationship to the varying areas of permanent deformation around cracks have also been recorded
Gettering and defect engineering in semiconductor technology( )

1 edition published in 1993 in English and held by 1 WorldCat member library worldwide

 
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Proceedings of the 10th International Autumn Meeting Gettering and defect engineering in semiconductor technology : GADEST 2003, Seehotel Zeuthen (suburb of Berlin), State of Brandenburg, Germany, September 21-26, 2003
Alternative Names
Hans Richter

Richter, H.

Richter, Hans 1940-

Languages
English (46)

German (1)

Covers
Techniques and challenges for 300 mm silicon : processing, characterization, modelling and equipment : proceedings of Symposium F on Techniques and Challenges for 300 mm Silicon of the E-MRS 1998 Spring Conference, Strasbourg, France, 16-19 June 1998Proceedings of the 6th Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology : GADEST '95 : held in Parkhotel Schloss Wulkow, near Berlin, Germany, September 02-07 1995Gettering and defect engineering in semiconductor technology XIII : GADEST 2009 : proceedings of the XIIIth International Autumn Meeting, Dölnsee-Schorfheide, north of Berlin, Germany, September 26-October 02, 2009Gettering and defect engineering in semiconductor technology : GADEST '95 : proceedings of the 6th Autumn Meeting held in Park Hotel Schlob Wulkow, near Berlin, Germany September 02-07, 1995Techniques and challenges for 300 mm silicon : processing, characterization, modelling and equipment / proceedings of Symposium F on Techniques and Challenges for 300mm Silicon of the E-MRS Spring Conference, Strasbourg, France, 16-19 June 1998 ; edited by H. Richter, P. Wagner, G. Ritter