WorldCat Identities

Electronic Device Failure Analysis Society

Overview
Works: 51 works in 123 publications in 1 language and 13,293 library holdings
Genres: Periodicals  Conference papers and proceedings  Handbooks and manuals 
Classifications: TK7870, 621
Publication Timeline
.
Most widely held works by Electronic Device Failure Analysis Society
Electronic device failure analysis( )

in English and Undetermined and held by 502 WorldCat member libraries worldwide

ISTFA '99 : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California by Electronic Device Failure Analysis Society( Book )

4 editions published in 1999 in English and held by 29 WorldCat member libraries worldwide

ISTFA 2000 : proceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington by Electronic Device Failure Analysis Society( Book )

6 editions published in 2000 in English and held by 26 WorldCat member libraries worldwide

Printbegrnsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
Microelectronic failure analysis : desk reference : 2001 supplement( Book )

4 editions published in 2001 in English and held by 24 WorldCat member libraries worldwide

ISTFA 2005 : Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California by International Symposium for Testing and Failure Analysis( Book )

5 editions published in 2005 in English and held by 24 WorldCat member libraries worldwide

ISTFA 2003 : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California by International Symposium for Testing and Failure Analysis( Book )

5 editions published in 2003 in English and held by 23 WorldCat member libraries worldwide

ISTFA 2002 : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. by International Symposium for Testing and Failure Analysis( Book )

5 editions published in 2002 in English and held by 22 WorldCat member libraries worldwide

Printbegrnsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2001 : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California by International Symposium for Testing and Failure Analysis( Book )

5 editions published in 2001 in English and held by 21 WorldCat member libraries worldwide

ISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA by International Symposium for Testing and Failure Analysis( Book )

5 editions published in 2007 in English and held by 21 WorldCat member libraries worldwide

ISTFA 2004 : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts by International Symposium for Testing and Failure Analysis( Book )

6 editions published in 2004 in English and held by 20 WorldCat member libraries worldwide

Contains complete text of the conference proceedings
ISTFA 2009 : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA by International Symposium for Testing and Failure Analysis( Book )

5 editions published in 2009 in English and held by 18 WorldCat member libraries worldwide

Printbegrnsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2010 : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA by International Symposium for Testing and Failure Analysis( Book )

5 editions published in 2010 in English and held by 14 WorldCat member libraries worldwide

ISTFA 2006 : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA by International Symposium for Testing and Failure Analysis( Book )

2 editions published in 2006 in English and held by 13 WorldCat member libraries worldwide

ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California by International Symposium for Testing and Failure Analysis( Book )

2 editions published in 2011 in English and held by 9 WorldCat member libraries worldwide

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA by International Symposium for Testing and Failure Analysis( Book )

3 editions published in 2013 in English and held by 4 WorldCat member libraries worldwide

Microelectronic failure analysis : desk reference( Book )

4 editions published in 2002 in English and held by 3 WorldCat member libraries worldwide

Annotation
ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA by International Symposium for Testing and Failure Analysis( Book )

4 editions published in 2008 in English and held by 3 WorldCat member libraries worldwide

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA by International Symposium for Testing and Failure Analysis( Book )

4 editions published in 2011 in English and held by 3 WorldCat member libraries worldwide

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA by International Symposium for Testing and Failure Analysis( Book )

3 editions published in 2014 in English and held by 2 WorldCat member libraries worldwide

Microelectronics failure analysis : desk reference by Richard J Ross( Book )

3 editions published in 2011 in English and held by 1 WorldCat member library worldwide

 
moreShow More Titles
fewerShow Fewer Titles
Audience Level
0
Audience Level
1
  Kids General Special  
Audience level: 0.25 (from 0.00 for ISTFA 2011 ... to 0.31 for Electronic ...)

ISTFA '99 : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California
Alternative Names
ASM International Electronic Device Failure Analysis Society

EDFAS

EDFAS (Organization)

Languages
English (87)

Covers
ISTFA 2005 : Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, CaliforniaISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USAISTFA 2009 : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA