WorldCat Identities

Electronic Device Failure Analysis Society

Overview
Works: 53 works in 121 publications in 1 language and 11,210 library holdings
Genres: Conference proceedings  Handbooks, manuals, etc  Periodicals 
Classifications: TK7871, 621.381548
Publication Timeline
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Most widely held works by Electronic Device Failure Analysis Society
Microelectronics failure analysis desk reference( )

2 editions published in 2011 in English and held by 1,109 WorldCat member libraries worldwide

Microelectronic failure analysis desk reference : 2001 supplement( )

5 editions published in 2001 in English and held by 1,054 WorldCat member libraries worldwide

Microelectronic failure analysis desk reference : 2002 supplement( )

5 editions published in 2002 in English and held by 1,038 WorldCat member libraries worldwide

Annotation
ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California by International Symposium for Testing and Failure Analysis( )

5 editions published in 2005 in English and held by 964 WorldCat member libraries worldwide

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California by International Symposium for Testing and Failure Analysis( )

5 editions published in 2001 in English and held by 961 WorldCat member libraries worldwide

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA by International Symposium for Testing and Failure Analysis( )

5 editions published in 2007 in English and held by 957 WorldCat member libraries worldwide

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA by International Symposium for Testing and Failure Analysis( )

2 editions published in 2006 in English and held by 950 WorldCat member libraries worldwide

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California by International Symposium for Testing and Failure Analysis( )

5 editions published in 2003 in English and held by 947 WorldCat member libraries worldwide

ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California by International Symposium for Testing and Failure Analysis( )

2 editions published in 2011 in English and held by 782 WorldCat member libraries worldwide

Electronic device failure analysis( )

in English and held by 386 WorldCat member libraries worldwide

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA by International Symposium for Testing and Failure Analysis( )

5 editions published in 2009 in English and held by 259 WorldCat member libraries worldwide

Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA by International Symposium for Testing and Failure Analysis( )

6 editions published in 2010 in English and held by 258 WorldCat member libraries worldwide

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. by International Symposium for Testing and Failure Analysis( )

5 editions published in 2002 in English and held by 256 WorldCat member libraries worldwide

Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington by Electronic Device Failure Analysis Society( )

6 editions published in 2000 in English and held by 255 WorldCat member libraries worldwide

Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts by International Symposium for Testing and Failure Analysis( )

6 editions published in 2004 in English and held by 246 WorldCat member libraries worldwide

Contains complete text of the conference proceedings
ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA by International Symposium for Testing and Failure Analysis( )

4 editions published in 2011 in English and held by 239 WorldCat member libraries worldwide

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California by Electronic Device Failure Analysis Society( )

4 editions published in 1999 in English and held by 228 WorldCat member libraries worldwide

Istfa 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA by International Symposium for Testing and Failure Analysis( )

4 editions published in 2008 in English and held by 225 WorldCat member libraries worldwide

ISTFA 2008 : conference proceedings of the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA by International Symposium for Testing and Failure Analysis( Book )

2 editions published in 2008 in English and held by 17 WorldCat member libraries worldwide

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA by International Symposium for Testing and Failure Analysis( )

2 editions published in 2013 in English and held by 12 WorldCat member libraries worldwide

 
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Audience Level
0
Audience Level
1
  Kids General Special  
Audience level: 0.43 (from 0.35 for ISTFA 2011 ... to 0.70 for ISTFA 2008 ...)

Alternative Names
ASM International Electronic Device Failure Analysis Society

EDFAS

EDFAS (Organization)

Languages
English (82)

Covers
ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USAISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USAISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, CaliforniaISTFA 2008 : conference proceedings of the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA