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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/173717590 Title: Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, 2000 Publisher: Oxford : Elsevier Science, [2000]. ISBN/ISSN: 0080439144 9780080439143 OCLC:173717590

  
  

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Subjects

• Electronic apparatus and appliances -- Reliability -- Congresses.
• Electronic apparatus and appliances -- Testing -- Congresses.
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Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, 2000