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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/60558678 Title: Data mining and diagnosing IC fails Author: Leendert M Huisman Publisher: New York : Springer, 2005. ISBN/ISSN: 0387249931 9780387249933 9780387263519 0387263519 OCLC:60558678

  
  

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Subjects

• Integrated circuits -- Testing -- Statistical methods.
• Semiconductors -- Failures.
• Data mining.

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Data mining and diagnosing IC fails