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Fundamentals of surface and thin film analysis
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Fundamentals of surface and thin film analysis

Author: Leonard C Feldman; James W Mayer
Publisher: New York : North-Holland, ©1986.
Edition/Format: Book : EnglishView all editions and formats
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Document Type: Book
All Authors / Contributors: Leonard C Feldman; James W Mayer
ISBN: 0444009892 9780444009890
OCLC Number: 13214540
Description: xviii, 352 p. : ill. ; 24 cm.
Responsibility: Leonard C. Feldman, James W. Mayer.

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