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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/49752005 Title: Proceedings : 20th IEEE VLSI Test Symposium : (VTS 2002) : 28 April - 2 May 2002, Monterey, California Publisher: Los Alamitos, Calif. : IEEE Computer Society, ©2002. ISBN/ISSN: 0769515703 9780769515700 0769515711 9780769515717 076951572X 9780769515724 OCLC:49752005

  
  

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Subjects

• Integrated circuits -- Very large scale integration -- Testing -- Congresses.

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Proceedings : 20th IEEE VLSI Test Symposium : (VTS 2002) : 28 April - 2 May 2002, Monterey, California