skip to content
Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.

Proceedings : 16-19 November 2003, Xi'an, China
ClosePreview this item

Proceedings : 16-19 November 2003, Xi'an, China

Publisher: Los Alamitos, Calif. [u.a.] : IEEE Computer Society, 2003.
Edition/Format: Book : English
Rating:

Retrieving ratings and reviews data...  

 

Find a copy in the library

Retrieving... Finding libraries that hold this item...

Details

Document Type: Book
ISBN: 0769519512 9780769519517
OCLC Number: 249147653
Description: XXI, 517 S.
Responsibility: sponsored by Test Technology Technical Council of IEEE Computer Society. In cooperation with Technical Committee on Fault Tolerant Computing of CCF ...

Reviews

Retrieving WorldCat reviews...
Retrieving EMRO reviews...
Retrieving weRead reviews...
Retrieving GoodReads reviews...
Retrieving Amazon reviews...

Tags

Be the first.

Similar Items

Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.