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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/55634022 Title: Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California Author: Tom Wit; Adit Singh; Rochit Rajsuman; IEEE Computer Society; IEEE Computer Society. Technical Committee on VLSI; IEEE Computer Society. Technical Council on Test Technology; IEEE Solid-State Circuits Society Publisher: Los Alamitos, Calif. : IEEE Computer Society, ©2003. ISBN/ISSN: 0769520049 9780769520049 OCLC:55634022

  
  

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Subjects

• Semiconductor storage devices -- Testing -- Congresses.
• Random access memory -- Congresses.

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Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California