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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/300355939 Title: Digital systems testing and testable design Author: Miron Abramovici; Melvin A Breuer; Arthur D Friedman Publisher: New York, N. Y. : Computer Science Press, ©1990. ISBN/ISSN: 0780310543 9780780310544 OCLC:300355939

  
  

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Subjects

• Circuits intégrés numériques -- Essais.
• Circuits intégrés numériques -- Conception et construction.

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Digital systems testing and testable design