• Cite/Export
  Cite/Export

  Copy a citation

  APA

  

  Chicago (Author-Date)

  

  Harvard

  

  MLA

  

  Turabian

  

  Export a citation

  Export to RefWorks   Export to EndNote   Cancel

  Note: Citations are based on reference standards. However, formatting rules can vary widely between applications and fields of interest or study. The specific requirements or preferences of your reviewing publisher, classroom teacher, institution or organization should be applied.
• Print
• E-mail
  E-mail

  All fields are required.

  The E-mail Address(es) field is required. Please enter recipient e-mail address(es).

  The E-mail Address(es) you entered is(are) not in a valid format. Please re-enter recipient e-mail address(es).

  You may send this item to up to five recipients.

  Enter recipient e-mail address(es): Separate up to five addresses with commas (,)

  The name field is required. Please enter your name.

  Enter your name:

  Your e-mail address is required. Please enter your e-mail address.

  Your e-mail address you entered is not in a valid format. Please re-enter your e-mail address.

  Enter your e-mail address: The subject field is required. Please enter the subject. Subject:

  The E-mail message field is required. Please enter the message.

  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/34647721 Title: Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits Author: Soon Huat Ong; M K Radhakrishnan; IEEE Singapore Section. Reliability/CPMT/EDS Chapter; IEEE Electron Devices Society; National University of Singapore. Centre for IC Failure Analysis and Reliability; Institute of Microelectronics; Magnetics Technology Centre Publisher: Piscataway, NJ : Institute of Electrical and Electronics Engineers, 1995. ISBN/ISSN: 0780327977 9780780327979 0780327985 9780780327986 OCLC:34647721

  
  

  The ReCaptcha terms you entered were incorrect. Please try to match the 2 words shown in the window, or try the audio version.

  Cancel
• Share
• Permalink
  Permalink

  Copy this URL to link to this page:

• Write a review
• Rate this item:
• • 1
  • 2
  • 3
  • 4
  • 5

More like this

Subjects

• Integrated circuits -- Defects -- Congresses.
• Integrated circuits -- Testing -- Congresses.

Similar Items

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits