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Semiconductor device reliability
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Semiconductor device reliability

Author: A Christou; B A Unger
Publisher: Dordrecht ; Boston : Kluwer Academic Publishers, ©1990.
Series: NATO ASI series., Series E,, Applied sciences ;, no. 175.
Edition/Format: Book : Conference publication : EnglishView all editions and formats
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Material Type: Conference publication
Document Type: Book
All Authors / Contributors: A Christou; B A Unger
ISBN: 0792305361 9780792305361
OCLC Number: 21229335
Notes: "Proceedings of the NATO Advanced Research Workshop on Semiconductor Device Reliability, Heraklio, Crete, Greece, June 4-9, 1989"--T.p. verso. "Published in cooperation with NATO Scientific Affairs Division."
Description: ix, 575 p. : ill. ; 25 cm.
Series Title: NATO ASI series., Series E,, Applied sciences ;, no. 175.
Responsibility: edited by A. Christou and B.A. Unger.

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