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| Document Type: | Book |
|---|---|
| All Authors / Contributors: |
Christopher M Barshick; Douglas C Duckworth; D H Smith |
| ISBN: | 0824702433 9780824702434 |
| OCLC Number: | 43114317 |
| Description: | viii, 512 p. : ill. ; 24 cm. |
| Contents: | Thermal ionization mass spectrometry / David H. Smith -- Glow discharge mass spectrometry / Christopher M. Barshick -- Inductively coupled plasma mass spectrometry / John W. Olesik -- Secondary ion mass spectrometry / Stephen S. Cristy -- Isotope dilution mass spectrometry / David H. Smith -- The emission of ions from high-temperature condensed phase materials / James E. Delmore -- Analysis of nonconductive sample types by glow discharge mass spectrometry / R. Kenneth Marcus -- Multiple-collector inductively coupled plasma mass spectrometry / Alex N. Halliday ... [et al.] -- Ion traps and their application to elemental analysis / Douglas C. Duckworth, John R. Eyler, and Clifford H. Watson -- Elemental speciaton by inorganic mass spectrometry / Karen L. Sutton, Kathryn L. Ackley, and Joseph A. Caruso -- Geological applications of secondary ion mass spectrometry / Lee R. Riciputi -- Inorganic time-of-flight mass spectrometry / David P. Myers, Steven J. Ray, and Gary M. Hieftje. |
| Series Title: | Practical spectroscopy, 23 |
| Responsibility: | edited by Christopher M. Barshick, Douglas C. Duckworth, David H. Smith. |
| More information: |
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