• Cite/Export
  Cite/Export

  Copy a citation

  APA

  

  Chicago (Author-Date)

  

  Harvard

  

  MLA

  

  Turabian

  

  Export a citation

  Export to RefWorks   Export to EndNote   Cancel

  Note: Citations are based on reference standards. However, formatting rules can vary widely between applications and fields of interest or study. The specific requirements or preferences of your reviewing publisher, classroom teacher, institution or organization should be applied.
• Print
• E-mail
  E-mail

  All fields are required.

  The E-mail Address(es) field is required. Please enter recipient e-mail address(es).

  The E-mail Address(es) you entered is(are) not in a valid format. Please re-enter recipient e-mail address(es).

  You may send this item to up to five recipients.

  Enter recipient e-mail address(es): Separate up to five addresses with commas (,)

  The name field is required. Please enter your name.

  Enter your name:

  Your e-mail address is required. Please enter your e-mail address.

  Your e-mail address you entered is not in a valid format. Please re-enter your e-mail address.

  Enter your e-mail address: The subject field is required. Please enter the subject. Subject:

  The E-mail message field is required. Please enter the message.

  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/17327921 Title: Stereology and morphometry in electron microscopy : problems and solutions Author: Albrecht Reith; Terry M Mayhew Publisher: New York : Hemisphere Pub. Corp., ©1988. ISBN/ISSN: 0891166238 : 9780891166238 OCLC:17327921

  
  

  The ReCaptcha terms you entered were incorrect. Please try to match the 2 words shown in the window, or try the audio version.

  Cancel
• Share
• Permalink
  Permalink

  Copy this URL to link to this page:

• Write a review
• Rate this item:
• • 1
  • 2
  • 3
  • 4
  • 5

More like this

Subjects

• Electron microscopy -- Technique.
• Stereology.
• Histological Techniques.
• View all subjects

Similar Items

Stereology and morphometry in electron microscopy : problems and solutions