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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/60800803 Title: Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications Author: S Rein Publisher: Berlin ; New York : Springer, ©2005. ISBN/ISSN: 3540253033 9783540253037 OCLC:60800803

  
  

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Subjects

• Silicon crystals -- Defects.
• Silicon crystals -- Spectra.
• Semiconductors -- Defects.

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Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications