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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/64596020 Title: Journey to data quality Author: Yang W Lee Publisher: Cambridge, Mass. : MIT Press, ©2006. ISBN/ISSN: 0262122871 9780262122870 OCLC:64596020

  
  

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• Business -- Data processing -- Management.
• Database management -- Quality control.
• Gestion -- Informatique -- Gestion.
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Journey to data quality