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Radiation effects and soft errors in integrated circuits and electronic devices
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Radiation effects and soft errors in integrated circuits and electronic devices

Author: Ronald Donald Schrimpf; D M Fleetwood
Publisher: Singapore ; New Jersey : World Scientific Pub., ©2004.
Series: Selected topics in electronics and systems, vol. 34
Edition/Format: Book : EnglishView all editions and formats
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Document Type: Book
All Authors / Contributors: Ronald Donald Schrimpf; D M Fleetwood
ISBN: 9812389407 9789812389404
OCLC Number: 56546079
Notes: Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623.
Description: viii, 339 p. : ill. ; 26 cm.
Series Title: Selected topics in electronics and systems, vol. 34
Other Titles: International journal of high speed electronics and systems,
Responsibility: editors, R.D. Schrimpf, D.M. Fleetwood.

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