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The 10th International Conference on X-ray Microscopy, Chicago, Illinois, USA, 15-20 August 2010

Author: Ian McNulty; Catherine E Eyberger; Barry Lai
Publisher: Mellville, N.Y. : American Institute of Physics, 2011.
Series: AIP conference proceedings, no. 1365.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
Summary:

Would be of interest to researchers in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Ian McNulty; Catherine E Eyberger; Barry Lai
ISBN: 9780735409255 0735409250
OCLC Number: 754745672
Description: xii, 473 pages : illustrations ; 28 cm.
Contents: X-ray facilities, instruments, and optics --
X-ray microscopy methods --
Environmental, earth, and space science --
Biological and biomedical science --
Materials and condensed matter.
Series Title: AIP conference proceedings, no. 1365.
Other Titles: Tenth International Conference on X-Ray Microscopy
X-ray microscopy
Responsibility: editors, Ian McNulty, Catherine Eyberger, Barry Lai.
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