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10th International Symposium on Software Metrics : proceedings : Chicago, Illinois, September 11-17, 2004

Author: IEEE Computer Society. Technical Council on Software Engineering.
Publisher: Los Alamitos, Calif. : IEEE Computer Society, ©2004.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:
Annotation

METRICS explores the latest studies in software measurement, empirical software engineering, and software quality. It focuses on the practice of software measurement, and on the use of data to understand, evaluate and model software engineering phenomena.

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society. Technical Council on Software Engineering.
ISBN: 0769521290 9780769521299
OCLC Number: 57044968
Notes: "METRICS 2004"--Half title page.
"IEEE Computer Society Order Number P2129"--Title page verso.
Description: 1 online resource (xii, 417 pages) : illustrations
Other Titles: Software Metrics, 2004, proceedings, 10th International Symposium on.
METRICS 2004
IEEE Symposium on Software Metrics
Responsibility: sponsored by IEEE Computer Society Technical Council on Software Engineering (TCSE).

Abstract:

Annotation

METRICS explores the latest studies in software measurement, empirical software engineering, and software quality. It focuses on the practice of software measurement, and on the use of data to understand, evaluate and model software engineering phenomena.

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