skip to content
14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey : proceedings Preview this item
ClosePreview this item
Checking...

14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey : proceedings

Author: IEEE Computer Society. Test Technology Technical Committee.; Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section.
Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, ©1996.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

Reports on recent concepts, methodologies, and trends in testing electronic circuits and systems to meet the challenges of a wider range of capabilities being integrated into compact products, and  Read more...

Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section.
ISBN: 0818673044 9780818673047 0818673060 9780818673061
OCLC Number: 35160224
Notes: "IEEE Computer Society Press order number PR07304"--Title page verso.
"IEEE Order Plan number 96TB100043"--Title page verso.
Description: xxix, 510 pages : illustrations ; 28 cm
Other Titles: VLSI Test Symposium, 1996, proceedings of 14th.
Fourteenth IEEE VLSI Test Symposium
Responsibility: sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/35160224> # 14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey : proceedings
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "35160224" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1151670757#Place/los_alamitos_calif> ; # Los Alamitos, Calif.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/cau> ;
   rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/1151670757#CreativeWork/vlsi_test_symposium_1996_proceedings_of_14th> ; # VLSI Test Symposium, 1996, proceedings of 14th.
   schema:about <http://id.worldcat.org/fast/975618> ; # Integrated circuits--Very large scale integration--Testing
   schema:about <http://id.loc.gov/authorities/subjects/sh2009127319> ; # Integrated circuits--Very large scale integration--Testing
   schema:about <http://dewey.info/class/621.3950287/e21/> ;
   schema:alternateName "Fourteenth IEEE VLSI Test Symposium" ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://experiment.worldcat.org/entity/work/data/1151670757#Organization/institution_of_electrical_and_electronics_incorporated_engineers_philadelphia_section> ; # Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section.
   schema:contributor <http://viaf.org/viaf/151378625> ; # IEEE Computer Society. Test Technology Technical Committee.
   schema:copyrightYear "1996" ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/1151670757#Meeting/ieee_vlsi_test_symposium_14th_1996_princeton_n_j> ; # IEEE VLSI Test Symposium (14th : 1996 : Princeton, N.J.)
   schema:datePublished "1996" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/1151670757> ;
   schema:genre "Conference publication"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:name "14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey : proceedings"@en ;
   schema:productID "35160224" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/35160224#PublicationEvent/los_alamitos_calif_ieee_computer_society_press_1996> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/1151670757#Agent/ieee_computer_society_press> ; # IEEE Computer Society Press
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=3739> ;
   schema:workExample <http://worldcat.org/isbn/9780818673047> ;
   schema:workExample <http://worldcat.org/isbn/9780818673061> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/35160224> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1151670757#Agent/ieee_computer_society_press> # IEEE Computer Society Press
    a bgn:Agent ;
   schema:name "IEEE Computer Society Press" ;
    .

<http://experiment.worldcat.org/entity/work/data/1151670757#CreativeWork/vlsi_test_symposium_1996_proceedings_of_14th> # VLSI Test Symposium, 1996, proceedings of 14th.
    a schema:CreativeWork ;
   schema:name "VLSI Test Symposium, 1996, proceedings of 14th." ;
    .

<http://experiment.worldcat.org/entity/work/data/1151670757#Meeting/ieee_vlsi_test_symposium_14th_1996_princeton_n_j> # IEEE VLSI Test Symposium (14th : 1996 : Princeton, N.J.)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/1151670757#Place/princeton_n_j> ; # Princeton, N.J.)
   schema:name "IEEE VLSI Test Symposium (14th : 1996 : Princeton, N.J.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/1151670757#Organization/institution_of_electrical_and_electronics_incorporated_engineers_philadelphia_section> # Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section.
    a schema:Organization ;
   schema:name "Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section." ;
    .

<http://experiment.worldcat.org/entity/work/data/1151670757#Place/los_alamitos_calif> # Los Alamitos, Calif.
    a schema:Place ;
   schema:name "Los Alamitos, Calif." ;
    .

<http://experiment.worldcat.org/entity/work/data/1151670757#Place/princeton_n_j> # Princeton, N.J.)
    a schema:Place ;
   schema:name "Princeton, N.J.)" ;
    .

<http://id.loc.gov/authorities/subjects/sh2009127319> # Integrated circuits--Very large scale integration--Testing
    a schema:Intangible ;
   schema:name "Integrated circuits--Very large scale integration--Testing"@en ;
    .

<http://id.worldcat.org/fast/975618> # Integrated circuits--Very large scale integration--Testing
    a schema:Intangible ;
   schema:name "Integrated circuits--Very large scale integration--Testing"@en ;
    .

<http://viaf.org/viaf/151378625> # IEEE Computer Society. Test Technology Technical Committee.
    a schema:Organization ;
   schema:name "IEEE Computer Society. Test Technology Technical Committee." ;
    .

<http://worldcat.org/isbn/9780818673047>
    a schema:ProductModel ;
   schema:isbn "0818673044" ;
   schema:isbn "9780818673047" ;
    .

<http://worldcat.org/isbn/9780818673061>
    a schema:ProductModel ;
   schema:isbn "0818673060" ;
   schema:isbn "9780818673061" ;
    .

<http://www.worldcat.org/title/-/oclc/35160224>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/35160224> ; # 14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey : proceedings
   schema:dateModified "2018-03-09" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.