skip to content
16th IEEE VLSI Test Symposium : proceedings : April 26-30, 1998, Monterey, California Preview this item
ClosePreview this item
Checking...

16th IEEE VLSI Test Symposium : proceedings : April 26-30, 1998, Monterey, California

Author: IEEE Computer Society. Test Technology Technical Committee.; Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section.
Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, ©1998.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
IEEE VLSI Test Symposium (16th : 1998 : Monterey, Calif.).
16th IEEE VLSI Test Symposium.
Los Alamitos, Calif. : IEEE Computer Society Press, ©1998
(DLC) 98659012
(OCoLC)39141287
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section.
OCLC Number: 47873205
Notes: "IEEE Computer Society Order Number PR08436--T.p. verso.
"IEEE Order Plan Catalog Number 98TB100231"--Title page verso.
Description: 1 online resource (xxxv, 472 pages) : illustrations
Other Titles: VLSI Test Symposium
VLSI Test Symposium, 1998, proceedings, 16th IEEE
Responsibility: sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/47873205> # 16th IEEE VLSI Test Symposium : proceedings : April 26-30, 1998, Monterey, California
    a schema:CreativeWork, schema:MediaObject, schema:Book ;
   library:oclcnum "47873205" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/20506960#Place/los_alamitos_calif> ; # Los Alamitos, Calif.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/cau> ;
   schema:about <http://id.loc.gov/authorities/subjects/sh2009127319> ; # Integrated circuits--Very large scale integration--Testing
   schema:about <http://id.worldcat.org/fast/975618> ; # Integrated circuits--Very large scale integration--Testing
   schema:about <http://dewey.info/class/621.395/e21/> ;
   schema:alternateName "VLSI Test Symposium" ;
   schema:alternateName "VLSI Test Symposium, 1998, proceedings, 16th IEEE" ;
   schema:bookFormat schema:EBook ;
   schema:contributor <http://experiment.worldcat.org/entity/work/data/20506960#Organization/institution_of_electrical_and_electronics_incorporated_engineers_philadelphia_section> ; # Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section.
   schema:contributor <http://viaf.org/viaf/151378625> ; # IEEE Computer Society. Test Technology Technical Committee.
   schema:copyrightYear "1998" ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/20506960#Meeting/ieee_vlsi_test_symposium_16th_1998_monterey_calif> ; # IEEE VLSI Test Symposium (16th : 1998 : Monterey, Calif.)
   schema:datePublished "1998" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/20506960> ;
   schema:genre "Conference publication"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/39141287> ;
   schema:name "16th IEEE VLSI Test Symposium : proceedings : April 26-30, 1998, Monterey, California"@en ;
   schema:productID "47873205" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/47873205#PublicationEvent/los_alamitos_calif_ieee_computer_society_press_1998> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/20506960#Agent/ieee_computer_society_press> ; # IEEE Computer Society Press
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=5496> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/47873205> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/20506960#Agent/ieee_computer_society_press> # IEEE Computer Society Press
    a bgn:Agent ;
   schema:name "IEEE Computer Society Press" ;
    .

<http://experiment.worldcat.org/entity/work/data/20506960#Meeting/ieee_vlsi_test_symposium_16th_1998_monterey_calif> # IEEE VLSI Test Symposium (16th : 1998 : Monterey, Calif.)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/20506960#Place/monterey_calif> ; # Monterey, Calif.)
   schema:name "IEEE VLSI Test Symposium (16th : 1998 : Monterey, Calif.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/20506960#Organization/institution_of_electrical_and_electronics_incorporated_engineers_philadelphia_section> # Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section.
    a schema:Organization ;
   schema:name "Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section." ;
    .

<http://experiment.worldcat.org/entity/work/data/20506960#Place/los_alamitos_calif> # Los Alamitos, Calif.
    a schema:Place ;
   schema:name "Los Alamitos, Calif." ;
    .

<http://experiment.worldcat.org/entity/work/data/20506960#Place/monterey_calif> # Monterey, Calif.)
    a schema:Place ;
   schema:name "Monterey, Calif.)" ;
    .

<http://id.loc.gov/authorities/subjects/sh2009127319> # Integrated circuits--Very large scale integration--Testing
    a schema:Intangible ;
   schema:name "Integrated circuits--Very large scale integration--Testing"@en ;
    .

<http://id.worldcat.org/fast/975618> # Integrated circuits--Very large scale integration--Testing
    a schema:Intangible ;
   schema:name "Integrated circuits--Very large scale integration--Testing"@en ;
    .

<http://viaf.org/viaf/151378625> # IEEE Computer Society. Test Technology Technical Committee.
    a schema:Organization ;
   schema:name "IEEE Computer Society. Test Technology Technical Committee." ;
    .

<http://www.worldcat.org/oclc/39141287>
    a schema:CreativeWork ;
   rdfs:label "16th IEEE VLSI Test Symposium." ;
   schema:description "Print version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/47873205> ; # 16th IEEE VLSI Test Symposium : proceedings : April 26-30, 1998, Monterey, California
    .

<http://www.worldcat.org/title/-/oclc/47873205>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/47873205> ; # 16th IEEE VLSI Test Symposium : proceedings : April 26-30, 1998, Monterey, California
   schema:dateModified "2018-03-12" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.