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17th IEEE VLSI Test Symposium : proceedings : April 25-29, 1999, Dana Point, California

Author: IEEE Computer Society. Technical Council on Test Technology.
Publisher: Los Alamitos, Calif. : IEEE Computer Society, ©1999.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Computer Society. Technical Council on Test Technology.
ISBN: 076950146X 9780769501468
OCLC Number: 41566688
Notes: "IEEE Computer Society Order Number PR00146"--Title page verso.
"IEEE Order Plan Catalog Number PR00146"--Title page verso.
Description: xxxii, 488 pages : illustrations ; 28 cm
Other Titles: VLSI Test Symposium, 1999, proceedings, 17th IEEE.
Seventeenth IEEE VLSI Test Symposium
Responsibility: sponsored by IEEE Computer Society Test Technology Technical Council.

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Primary Entity

<http://www.worldcat.org/oclc/41566688> # 17th IEEE VLSI Test Symposium : proceedings : April 25-29, 1999, Dana Point, California
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "41566688" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1152073354#Place/los_alamitos_calif> ; # Los Alamitos, Calif.
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/cau> ;
    rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/1152073354#CreativeWork/vlsi_test_symposium_1999_proceedings_17th_ieee> ; # VLSI Test Symposium, 1999, proceedings, 17th IEEE.
    schema:about <http://id.worldcat.org/fast/975618> ; # Integrated circuits--Very large scale integration--Testing
    schema:about <http://id.loc.gov/authorities/subjects/sh2009127319> ; # Integrated circuits--Very large scale integration--Testing
    schema:alternateName "Seventeenth IEEE VLSI Test Symposium" ;
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/127803337> ; # IEEE Computer Society. Technical Council on Test Technology.
    schema:copyrightYear "1999" ;
    schema:creator <http://experiment.worldcat.org/entity/work/data/1152073354#Meeting/ieee_vlsi_test_symposium_17th_1999_dana_point_calif> ; # IEEE VLSI Test Symposium (17th : 1999 : Dana Point, Calif.)
    schema:datePublished "1999" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/1152073354> ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Conference publication"@en ;
    schema:inLanguage "en" ;
    schema:name "17th IEEE VLSI Test Symposium : proceedings : April 25-29, 1999, Dana Point, California"@en ;
    schema:productID "41566688" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/41566688#PublicationEvent/los_alamitos_calif_ieee_computer_society_1999> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/1152073354#Agent/ieee_computer_society> ; # IEEE Computer Society
    schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=6209> ;
    schema:workExample <http://worldcat.org/isbn/9780769501468> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/41566688> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1152073354#Agent/ieee_computer_society> # IEEE Computer Society
    a bgn:Agent ;
    schema:name "IEEE Computer Society" ;
    .

<http://experiment.worldcat.org/entity/work/data/1152073354#CreativeWork/vlsi_test_symposium_1999_proceedings_17th_ieee> # VLSI Test Symposium, 1999, proceedings, 17th IEEE.
    a schema:CreativeWork ;
    schema:name "VLSI Test Symposium, 1999, proceedings, 17th IEEE." ;
    .

<http://experiment.worldcat.org/entity/work/data/1152073354#Meeting/ieee_vlsi_test_symposium_17th_1999_dana_point_calif> # IEEE VLSI Test Symposium (17th : 1999 : Dana Point, Calif.)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/1152073354#Place/dana_point_calif> ; # Dana Point, Calif.)
    schema:name "IEEE VLSI Test Symposium (17th : 1999 : Dana Point, Calif.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/1152073354#Place/dana_point_calif> # Dana Point, Calif.)
    a schema:Place ;
    schema:name "Dana Point, Calif.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/1152073354#Place/los_alamitos_calif> # Los Alamitos, Calif.
    a schema:Place ;
    schema:name "Los Alamitos, Calif." ;
    .

<http://id.loc.gov/authorities/subjects/sh2009127319> # Integrated circuits--Very large scale integration--Testing
    a schema:Intangible ;
    schema:name "Integrated circuits--Very large scale integration--Testing"@en ;
    .

<http://id.worldcat.org/fast/975618> # Integrated circuits--Very large scale integration--Testing
    a schema:Intangible ;
    schema:name "Integrated circuits--Very large scale integration--Testing"@en ;
    .

<http://viaf.org/viaf/127803337> # IEEE Computer Society. Technical Council on Test Technology.
    a schema:Organization ;
    schema:name "IEEE Computer Society. Technical Council on Test Technology." ;
    .

<http://worldcat.org/isbn/9780769501468>
    a schema:ProductModel ;
    schema:isbn "076950146X" ;
    schema:isbn "9780769501468" ;
    .

<http://www.worldcat.org/title/-/oclc/41566688>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/41566688> ; # 17th IEEE VLSI Test Symposium : proceedings : April 25-29, 1999, Dana Point, California
    schema:dateModified "2018-07-23" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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