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1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994

Author: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: [New York] : IEEE Electron Devices Society : IEEE Reliability Society, [1994?]
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
ISBN: 0780319087 9780780319080 0780319095 9780780319097
OCLC Number: 32426337
Notes: "IEEE Catalogue No. 94TH0654-4."
Description: v, 24, 155 p. : ill. ; 28 cm.
Other Titles: Final report, 1994 International Integrated Reliability Workshop
Responsibility: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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