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1996 IEEE International Reliability Physics proceedings : 34th annual, Dallas, Texas, April 30, May 1, 2, 1996

Author: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: Piscataway, N.J. : Institute of Electrical and Electronics Engineers : IEEE Service Center, ©1996.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Dallas (Tex., 1996)
Kongress
Congresses
Additional Physical Format: Online version:
International Reliability Physics Symposium (34th : 1996 : Dallas, Tex.).
1996 IEEE International Reliability Physics proceedings.
Piscataway, N.J. : Institute of Electrical and Electronics Engineers : IEEE Service Center, ©1996
(OCoLC)763167167
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
ISBN: 0780327543 9780780327542 0780327535 9780780327535 0780327551 9780780327559
OCLC Number: 34969710
Notes: "IEEE catalog no. 96CH35825."
Description: vi, 396 pages : illustrations ; 28 cm
Other Titles: Reliability Physics Symposium, 1996, 34th annual proceedings, IEEE International.
1996 IEEE Annual International Reliability Physics
IEEE International Reliability Physics proceedings
Responsibility: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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Linked Data


Primary Entity

<http://www.worldcat.org/oclc/34969710> # 1996 IEEE International Reliability Physics proceedings : 34th annual, Dallas, Texas, April 30, May 1, 2, 1996
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "34969710" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nju> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/3856670706#Place/piscataway_n_j> ; # Piscataway, N.J.
   rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/3856670706#CreativeWork/reliability_physics_symposium_1996_34th_annual_proceedings_ieee_international> ; # Reliability Physics Symposium, 1996, 34th annual proceedings, IEEE International.
   schema:about <http://experiment.worldcat.org/entity/work/data/3856670706#Topic/elektronisches_bauelement> ; # Elektronisches Bauelement
   schema:about <http://id.worldcat.org/fast/906827> ; # Electronic apparatus and appliances--Reliability
   schema:about <http://experiment.worldcat.org/entity/work/data/3856670706#Topic/kongress> ; # Kongress
   schema:about <http://experiment.worldcat.org/entity/work/data/3856670706#Topic/electronic_apparatus_and_appliances_reliability> ; # Electronic apparatus and appliances--Reliability
   schema:about <http://experiment.worldcat.org/entity/work/data/3856670706#Topic/zuverlassigkeit> ; # Zuverlässigkeit
   schema:alternateName "1996 IEEE Annual International Reliability Physics" ;
   schema:alternateName "IEEE International Reliability Physics proceedings" ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/141934020> ; # IEEE Electron Devices Society.
   schema:contributor <http://viaf.org/viaf/132537053> ; # IEEE Reliability Society.
   schema:copyrightYear "1996" ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/3856670706#Meeting/international_reliability_physics_symposium_34th_1996_dallas_tex> ; # International Reliability Physics Symposium (34th : 1996 : Dallas, Tex.)
   schema:datePublished "1996" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/3856670706> ;
   schema:genre "Kongress"@en ;
   schema:genre "Conference publication"@en ;
   schema:genre "Dallas (Tex., 1996)"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/763167167> ;
   schema:name "1996 IEEE International Reliability Physics proceedings : 34th annual, Dallas, Texas, April 30, May 1, 2, 1996"@en ;
   schema:productID "34969710" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/34969710#PublicationEvent/piscataway_n_j_institute_of_electrical_and_electronics_engineers_ieee_service_center_1996> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/3856670706#Agent/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers
   schema:publisher <http://experiment.worldcat.org/entity/work/data/3856670706#Agent/ieee_service_center> ; # IEEE Service Center
   schema:url <http://www.ieeexplore.ieee.org/servlet/opac?punumber=3523> ;
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=3523> ;
   schema:workExample <http://worldcat.org/isbn/9780780327542> ;
   schema:workExample <http://worldcat.org/isbn/9780780327535> ;
   schema:workExample <http://worldcat.org/isbn/9780780327559> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/34969710> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/3856670706#Agent/ieee_service_center> # IEEE Service Center
    a bgn:Agent ;
   schema:name "IEEE Service Center" ;
    .

<http://experiment.worldcat.org/entity/work/data/3856670706#Agent/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers
    a bgn:Agent ;
   schema:name "Institute of Electrical and Electronics Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/3856670706#CreativeWork/reliability_physics_symposium_1996_34th_annual_proceedings_ieee_international> # Reliability Physics Symposium, 1996, 34th annual proceedings, IEEE International.
    a schema:CreativeWork ;
   schema:name "Reliability Physics Symposium, 1996, 34th annual proceedings, IEEE International." ;
    .

<http://experiment.worldcat.org/entity/work/data/3856670706#Meeting/international_reliability_physics_symposium_34th_1996_dallas_tex> # International Reliability Physics Symposium (34th : 1996 : Dallas, Tex.)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/3856670706#Place/dallas_tex> ; # Dallas, Tex.)
   schema:name "International Reliability Physics Symposium (34th : 1996 : Dallas, Tex.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/3856670706#Place/piscataway_n_j> # Piscataway, N.J.
    a schema:Place ;
   schema:name "Piscataway, N.J." ;
    .

<http://experiment.worldcat.org/entity/work/data/3856670706#Topic/electronic_apparatus_and_appliances_reliability> # Electronic apparatus and appliances--Reliability
    a schema:Intangible ;
   rdfs:seeAlso <http://id.loc.gov/authorities/subjects/sh2009124791> ;
   schema:name "Electronic apparatus and appliances--Reliability"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/3856670706#Topic/elektronisches_bauelement> # Elektronisches Bauelement
    a schema:Intangible ;
   schema:name "Elektronisches Bauelement"@en ;
    .

<http://id.worldcat.org/fast/906827> # Electronic apparatus and appliances--Reliability
    a schema:Intangible ;
   schema:name "Electronic apparatus and appliances--Reliability"@en ;
    .

<http://viaf.org/viaf/132537053> # IEEE Reliability Society.
    a schema:Organization ;
   schema:name "IEEE Reliability Society." ;
    .

<http://viaf.org/viaf/141934020> # IEEE Electron Devices Society.
    a schema:Organization ;
   schema:name "IEEE Electron Devices Society." ;
    .

<http://worldcat.org/isbn/9780780327535>
    a schema:ProductModel ;
   schema:isbn "0780327535" ;
   schema:isbn "9780780327535" ;
    .

<http://worldcat.org/isbn/9780780327542>
    a schema:ProductModel ;
   schema:isbn "0780327543" ;
   schema:isbn "9780780327542" ;
    .

<http://worldcat.org/isbn/9780780327559>
    a schema:ProductModel ;
   schema:isbn "0780327551" ;
   schema:isbn "9780780327559" ;
    .

<http://www.worldcat.org/oclc/763167167>
    a schema:CreativeWork ;
   rdfs:label "1996 IEEE International Reliability Physics proceedings." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/34969710> ; # 1996 IEEE International Reliability Physics proceedings : 34th annual, Dallas, Texas, April 30, May 1, 2, 1996
    .

<http://www.worldcat.org/title/-/oclc/34969710>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/34969710> ; # 1996 IEEE International Reliability Physics proceedings : 34th annual, Dallas, Texas, April 30, May 1, 2, 1996
   schema:dateModified "2017-12-23" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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