skip to content
1997 IEEE International Conference on Microelectronic Test Structures proceedings : March 17-20, 1997, Monterey, California Preview this item
ClosePreview this item
Checking...

1997 IEEE International Conference on Microelectronic Test Structures proceedings : March 17-20, 1997, Monterey, California

Author: IEEE Electron Devices Society.
Publisher: Piscataway, NJ : IEEE Service Center, ©1997.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Electron Devices Society.
ISBN: 0780332431 9780780332430 078033244X 9780780332447 0780332458 9780780332454
OCLC Number: 37046789
Notes: "97CH35914."
"97CB35914"--Spine.
Description: viii, 225 pages : illustrations ; 30 cm
Other Titles: Microelectronic Test Structures, 1997, ICMTS 1997, proceedings, IEEE International Conference on.
IEEE International Conference on Microelectronic Test Structures proceedings
International Conference on Microelectronic Test Structures proceedings
Responsibility: sponsored by the IEEE Electron Devices Society.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/37046789> # 1997 IEEE International Conference on Microelectronic Test Structures proceedings : March 17-20, 1997, Monterey, California
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "37046789" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/wau> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1151898866#Place/piscataway_nj> ; # Piscataway, NJ
   rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/1151898866#CreativeWork/microelectronic_test_structures_1997_icmts_1997_proceedings_ieee_international_conference_on> ; # Microelectronic Test Structures, 1997, ICMTS 1997, proceedings, IEEE International Conference on.
   schema:about <http://id.worldcat.org/fast/1019757> ; # Microelectronics
   schema:about <http://experiment.worldcat.org/entity/work/data/1151898866#Topic/microelectronique_essais_congres> ; # Microélectronique--Essais--Congrès
   schema:about <http://dewey.info/class/621.3817/e21/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/1151898866#Topic/microelectronics> ; # Microelectronics
   schema:about <http://id.worldcat.org/fast/975593> ; # Integrated circuits--Testing
   schema:about <http://experiment.worldcat.org/entity/work/data/1151898866#Topic/integrated_circuits_testing> ; # Integrated circuits--Testing
   schema:alternateName "International Conference on Microelectronic Test Structures proceedings" ;
   schema:alternateName "IEEE International Conference on Microelectronic Test Structures proceedings" ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/141934020> ; # IEEE Electron Devices Society.
   schema:copyrightYear "1997" ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/1151898866#Meeting/ieee_international_conference_on_microelectronic_test_structures_1997_monterey_calif> ; # IEEE International Conference on Microelectronic Test Structures (1997 : Monterey, Calif.)
   schema:datePublished "1997" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/1151898866> ;
   schema:genre "Conference publication"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:name "1997 IEEE International Conference on Microelectronic Test Structures proceedings : March 17-20, 1997, Monterey, California"@en ;
   schema:productID "37046789" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/37046789#PublicationEvent/piscataway_nj_ieee_service_center_1997> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/1151898866#Agent/ieee_service_center> ; # IEEE Service Center
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=4498> ;
   schema:url <http://www.ieeexplore.ieee.org/servlet/opac?punumber=4498> ;
   schema:workExample <http://worldcat.org/isbn/9780780332430> ;
   schema:workExample <http://worldcat.org/isbn/9780780332454> ;
   schema:workExample <http://worldcat.org/isbn/9780780332447> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/37046789> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1151898866#Agent/ieee_service_center> # IEEE Service Center
    a bgn:Agent ;
   schema:name "IEEE Service Center" ;
    .

<http://experiment.worldcat.org/entity/work/data/1151898866#CreativeWork/microelectronic_test_structures_1997_icmts_1997_proceedings_ieee_international_conference_on> # Microelectronic Test Structures, 1997, ICMTS 1997, proceedings, IEEE International Conference on.
    a schema:CreativeWork ;
   schema:name "Microelectronic Test Structures, 1997, ICMTS 1997, proceedings, IEEE International Conference on." ;
    .

<http://experiment.worldcat.org/entity/work/data/1151898866#Meeting/ieee_international_conference_on_microelectronic_test_structures_1997_monterey_calif> # IEEE International Conference on Microelectronic Test Structures (1997 : Monterey, Calif.)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/1151898866#Place/monterey_calif> ; # Monterey, Calif.)
   schema:name "IEEE International Conference on Microelectronic Test Structures (1997 : Monterey, Calif.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/1151898866#Place/monterey_calif> # Monterey, Calif.)
    a schema:Place ;
   schema:name "Monterey, Calif.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/1151898866#Topic/microelectronique_essais_congres> # Microélectronique--Essais--Congrès
    a schema:Intangible ;
   schema:name "Microélectronique--Essais--Congrès"@en ;
    .

<http://id.worldcat.org/fast/1019757> # Microelectronics
    a schema:Intangible ;
   schema:name "Microelectronics"@en ;
    .

<http://id.worldcat.org/fast/975593> # Integrated circuits--Testing
    a schema:Intangible ;
   schema:name "Integrated circuits--Testing"@en ;
    .

<http://viaf.org/viaf/141934020> # IEEE Electron Devices Society.
    a schema:Organization ;
   schema:name "IEEE Electron Devices Society." ;
    .

<http://worldcat.org/isbn/9780780332430>
    a schema:ProductModel ;
   schema:isbn "0780332431" ;
   schema:isbn "9780780332430" ;
    .

<http://worldcat.org/isbn/9780780332447>
    a schema:ProductModel ;
   schema:isbn "078033244X" ;
   schema:isbn "9780780332447" ;
    .

<http://worldcat.org/isbn/9780780332454>
    a schema:ProductModel ;
   schema:isbn "0780332458" ;
   schema:isbn "9780780332454" ;
    .

<http://www.worldcat.org/title/-/oclc/37046789>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/37046789> ; # 1997 IEEE International Conference on Microelectronic Test Structures proceedings : March 17-20, 1997, Monterey, California
   schema:dateModified "2018-03-11" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.