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1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997

Author: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: Piscataway, N.J. : IEEE Electron Devices Society : IEEE Reliability Society, ©1997.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:

The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics reproduced in this volume include:  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
International Integrated Reliability Workshop (1997 : Lake Tahoe, Calif.).
1997 IEEE International Integrated Reliability Workshop final report.
Piscataway, N.J. : IEEE Electron Devices Society : IEEE Reliability Society, ©1997
(DLC) 97080028
(OCoLC)38865152
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
ISBN: 0780342054 9780780342057 0780342062 9780780342064
OCLC Number: 47885635
Language Note: English.
Notes: "IEEE Catalog No. 97TH8319"--Title page verso.
Description: 1 online resource (v, 161 pages) : illustrations
Other Titles: Integrated Reliability Workshop final report, 1997 IEEE International
Responsibility: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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