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1999 IEEE Autotestcon proceedings : Autotestcon '99 : IEEE Systems Readiness Technology Conference : Test technology for the new millennium : August 30-September 2, 1999

Author: Institute of Electrical and Electronics Engineers.
Publisher: Piscataway, N.J. : IEEE, ©1999.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

The technical papers presented in these proceedings represent a cross section of government and industry viewpoints on a broad variety of topics of importance to the aerospace industry. The theme is  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Institute of Electrical and Electronics Engineers.
ISBN: 078035432X 9780780354326 0780354338 9780780354333 0780354346 9780780354340 0780355520 9780780355521
OCLC Number: 42896194
Notes: "IEEE Catalog Number: 99CH36323."
Description: xxix, 830 pages : illustrations ; 28 cm
Other Titles: AUTOTESTCON '99, IEEE Systems Readiness Technology Conference, 1999, IEEE.
1999 IEEE Autotestcon
Test technology for the new millennium
IEEE Systems Readiness Technology Conference
Responsibility: sponsored by the Institute of Electrical and Electronics Engineers [and others].

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Primary Entity

<http://www.worldcat.org/oclc/42896194> # 1999 IEEE Autotestcon proceedings : Autotestcon '99 : IEEE Systems Readiness Technology Conference : Test technology for the new millennium : August 30-September 2, 1999
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "42896194" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nju> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1151553378#Place/piscataway_n_j> ; # Piscataway, N.J.
   rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/1151553378#CreativeWork/autotestcon_99_ieee_systems_readiness_technology_conference_1999_ieee> ; # AUTOTESTCON '99, IEEE Systems Readiness Technology Conference, 1999, IEEE.
   schema:about <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/weapons_systems_technological_innovations> ; # Weapons systems--Technological innovations
   schema:about <http://id.worldcat.org/fast/907175> ; # Electronic digital computers--Testing
   schema:about <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/essais_technologie_congres> ; # Essais (technologie)--Congrès
   schema:about <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/maintenance_automatisee_congres> ; # Maintenance automatisée--Congrès
   schema:about <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_d_armes_innovations_congres> ; # Systèmes d'armes--Innovations--Congrès
   schema:about <http://dewey.info/class/629.135/e21/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systems_engineering> ; # Systems engineering
   schema:about <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/ingenierie_des_systemes_congres> ; # Ingénierie des systèmes--Congrès
   schema:about <http://id.worldcat.org/fast/1141455> ; # Systems engineering
   schema:about <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/electronic_digital_computers_testing> ; # Electronic digital computers--Testing
   schema:about <http://id.worldcat.org/fast/1173071> ; # Weapons systems--Technological innovations
   schema:alternateName "Test technology for the new millennium" ;
   schema:alternateName "1999 IEEE Autotestcon" ;
   schema:alternateName "IEEE Systems Readiness Technology Conference" ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/123926298> ; # Institute of Electrical and Electronics Engineers.
   schema:copyrightYear "1999" ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/1151553378#Meeting/autotestcon_1999_san_antonio_tex> ; # Autotestcon (1999 : San Antonio, Tex.)
   schema:datePublished "1999" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/1151553378> ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:genre "Conference publication"@en ;
   schema:inLanguage "en" ;
   schema:name "1999 IEEE Autotestcon proceedings : Autotestcon '99 : IEEE Systems Readiness Technology Conference : Test technology for the new millennium : August 30-September 2, 1999"@en ;
   schema:productID "42896194" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/42896194#PublicationEvent/piscataway_n_j_ieee_1999> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/1151553378#Agent/ieee> ; # IEEE
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=6502> ;
   schema:url <http://www.ieeexplore.ieee.org/servlet/opac?punumber=6502> ;
   schema:workExample <http://worldcat.org/isbn/9780780354326> ;
   schema:workExample <http://worldcat.org/isbn/9780780355521> ;
   schema:workExample <http://worldcat.org/isbn/9780780354333> ;
   schema:workExample <http://worldcat.org/isbn/9780780354340> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/42896194> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1151553378#CreativeWork/autotestcon_99_ieee_systems_readiness_technology_conference_1999_ieee> # AUTOTESTCON '99, IEEE Systems Readiness Technology Conference, 1999, IEEE.
    a schema:CreativeWork ;
   schema:name "AUTOTESTCON '99, IEEE Systems Readiness Technology Conference, 1999, IEEE." ;
    .

<http://experiment.worldcat.org/entity/work/data/1151553378#Place/piscataway_n_j> # Piscataway, N.J.
    a schema:Place ;
   schema:name "Piscataway, N.J." ;
    .

<http://experiment.worldcat.org/entity/work/data/1151553378#Place/san_antonio_tex> # San Antonio, Tex.)
    a schema:Place ;
   schema:name "San Antonio, Tex.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/essais_technologie_congres> # Essais (technologie)--Congrès
    a schema:Intangible ;
   schema:name "Essais (technologie)--Congrès"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/ingenierie_des_systemes_congres> # Ingénierie des systèmes--Congrès
    a schema:Intangible ;
   schema:name "Ingénierie des systèmes--Congrès"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/maintenance_automatisee_congres> # Maintenance automatisée--Congrès
    a schema:Intangible ;
   schema:name "Maintenance automatisée--Congrès"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_d_armes_innovations_congres> # Systèmes d'armes--Innovations--Congrès
    a schema:Intangible ;
   schema:name "Systèmes d'armes--Innovations--Congrès"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/weapons_systems_technological_innovations> # Weapons systems--Technological innovations
    a schema:Intangible ;
   schema:hasPart <http://id.loc.gov/authorities/subjects/sh85145837> ;
   schema:name "Weapons systems--Technological innovations"@en ;
    .

<http://id.worldcat.org/fast/1141455> # Systems engineering
    a schema:Intangible ;
   schema:name "Systems engineering"@en ;
    .

<http://id.worldcat.org/fast/1173071> # Weapons systems--Technological innovations
    a schema:Intangible ;
   schema:name "Weapons systems--Technological innovations"@en ;
    .

<http://id.worldcat.org/fast/907175> # Electronic digital computers--Testing
    a schema:Intangible ;
   schema:name "Electronic digital computers--Testing"@en ;
    .

<http://viaf.org/viaf/123926298> # Institute of Electrical and Electronics Engineers.
    a schema:Organization ;
   schema:name "Institute of Electrical and Electronics Engineers." ;
    .

<http://worldcat.org/isbn/9780780354326>
    a schema:ProductModel ;
   schema:isbn "078035432X" ;
   schema:isbn "9780780354326" ;
    .

<http://worldcat.org/isbn/9780780354333>
    a schema:ProductModel ;
   schema:isbn "0780354338" ;
   schema:isbn "9780780354333" ;
    .

<http://worldcat.org/isbn/9780780354340>
    a schema:ProductModel ;
   schema:isbn "0780354346" ;
   schema:isbn "9780780354340" ;
    .

<http://worldcat.org/isbn/9780780355521>
    a schema:ProductModel ;
   schema:isbn "0780355520" ;
   schema:isbn "9780780355521" ;
    .

<http://www.worldcat.org/title/-/oclc/42896194>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/42896194> ; # 1999 IEEE Autotestcon proceedings : Autotestcon '99 : IEEE Systems Readiness Technology Conference : Test technology for the new millennium : August 30-September 2, 1999
   schema:dateModified "2018-03-11" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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