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2000 IEEE International Reliability Physics Symposium : proceedings : 38th annual : San Jose, California, April 10-13, 2000

Author: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: Piscataway, N.J. : IEEE, ©2000.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
International Reliability Physics Symposium (38th : 2000 : San Jose, Calif.).
2000 IEEE International Reliability Physics Symposium.
Piscataway, N.J. : IEEE, ©2000
(OCoLC)44060152
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
OCLC Number: 47882635
Notes: "IEEE Catalog No. 00CH37059"--Cover and verso of title page.
Description: 1 online resource (vi1, 456 pages) : illustrations
Other Titles: Reliability physics
Reliability Physics Symposium, 2000, proceedings, 38th Annual 2000 IEEE International
Responsibility: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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