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2001 IEEE International Reliability Physics Symposium : proceedings : 39th annual : Orlando, Florida, April 30-May 3, 2001

Author: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: Piscataway, N.J. : IEEE, ©2001.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

Based on the 2001 IEEE International Reliability Physics Symposium, this electronic reference covers such topics as: device and process; device dielectrics; assembly and packaging; channel hot  Read more...

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Details

Genre/Form: Conference papers and proceedings
Orlando (Fla., 2001)
Kongress
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
ISBN: 0780365879 9780780365872 0780365887 9780780365889 0780365895 9780780365896
OCLC Number: 47050962
Notes: "IEEE Catalog No. 01CH37167."
Description: [xii], 464 pages : illustrations ; 28 cm
Other Titles: Reliability Physics Symposium, 2001, proceedings, 39th Annual, 2001 IEEE International.
Reliability physics
Responsibility: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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Primary Entity

<http://www.worldcat.org/oclc/47050962> # 2001 IEEE International Reliability Physics Symposium : proceedings : 39th annual : Orlando, Florida, April 30-May 3, 2001
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "47050962" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/10260798#Place/piscataway_n_j> ; # Piscataway, N.J.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nju> ;
   rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/10260798#CreativeWork/reliability_physics_symposium_2001_proceedings_39th_annual_2001_ieee_international> ; # Reliability Physics Symposium, 2001, proceedings, 39th Annual, 2001 IEEE International.
   schema:about <http://experiment.worldcat.org/entity/work/data/10260798#Topic/kongress> ; # Kongress
   schema:about <http://id.worldcat.org/fast/906827> ; # Electronic apparatus and appliances--Reliability
   schema:about <http://experiment.worldcat.org/entity/work/data/10260798#Topic/zuverlassigkeit> ; # Zuverlässigkeit
   schema:about <http://experiment.worldcat.org/entity/work/data/10260798#Topic/electronic_apparatus_and_appliances_reliability> ; # Electronic apparatus and appliances--Reliability
   schema:about <http://experiment.worldcat.org/entity/work/data/10260798#Topic/elektronisches_bauelement> ; # Elektronisches Bauelement
   schema:alternateName "Reliability physics" ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/132537053> ; # IEEE Reliability Society.
   schema:contributor <http://viaf.org/viaf/141934020> ; # IEEE Electron Devices Society.
   schema:copyrightYear "2001" ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/10260798#Meeting/international_reliability_physics_symposium_39th_2001_orlando_fla> ; # International Reliability Physics Symposium (39th : 2001 : Orlando, Fla.)
   schema:datePublished "2001" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/10260798> ;
   schema:genre "Kongress"@en ;
   schema:genre "Orlando (Fla., 2001)"@en ;
   schema:genre "Conference publication"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:name "2001 IEEE International Reliability Physics Symposium : proceedings : 39th annual : Orlando, Florida, April 30-May 3, 2001"@en ;
   schema:productID "47050962" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/47050962#PublicationEvent/piscataway_n_j_ieee_2001> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/10260798#Agent/ieee> ; # IEEE
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=7356> ;
   schema:url <http://www.ieeexplore.ieee.org/servlet/opac?punumber=7356> ;
   schema:workExample <http://worldcat.org/isbn/9780780365889> ;
   schema:workExample <http://worldcat.org/isbn/9780780365896> ;
   schema:workExample <http://worldcat.org/isbn/9780780365872> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/47050962> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/10260798#CreativeWork/reliability_physics_symposium_2001_proceedings_39th_annual_2001_ieee_international> # Reliability Physics Symposium, 2001, proceedings, 39th Annual, 2001 IEEE International.
    a schema:CreativeWork ;
   schema:name "Reliability Physics Symposium, 2001, proceedings, 39th Annual, 2001 IEEE International." ;
    .

<http://experiment.worldcat.org/entity/work/data/10260798#Meeting/international_reliability_physics_symposium_39th_2001_orlando_fla> # International Reliability Physics Symposium (39th : 2001 : Orlando, Fla.)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/10260798#Place/orlando_fla> ; # Orlando, Fla.)
   schema:name "International Reliability Physics Symposium (39th : 2001 : Orlando, Fla.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/10260798#Place/orlando_fla> # Orlando, Fla.)
    a schema:Place ;
   schema:name "Orlando, Fla.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/10260798#Place/piscataway_n_j> # Piscataway, N.J.
    a schema:Place ;
   schema:name "Piscataway, N.J." ;
    .

<http://experiment.worldcat.org/entity/work/data/10260798#Topic/electronic_apparatus_and_appliances_reliability> # Electronic apparatus and appliances--Reliability
    a schema:Intangible ;
   rdfs:seeAlso <http://id.loc.gov/authorities/subjects/sh2009124791> ;
   schema:name "Electronic apparatus and appliances--Reliability"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/10260798#Topic/elektronisches_bauelement> # Elektronisches Bauelement
    a schema:Intangible ;
   schema:name "Elektronisches Bauelement"@en ;
    .

<http://id.worldcat.org/fast/906827> # Electronic apparatus and appliances--Reliability
    a schema:Intangible ;
   schema:name "Electronic apparatus and appliances--Reliability"@en ;
    .

<http://viaf.org/viaf/132537053> # IEEE Reliability Society.
    a schema:Organization ;
   schema:name "IEEE Reliability Society." ;
    .

<http://viaf.org/viaf/141934020> # IEEE Electron Devices Society.
    a schema:Organization ;
   schema:name "IEEE Electron Devices Society." ;
    .

<http://worldcat.org/isbn/9780780365872>
    a schema:ProductModel ;
   schema:isbn "0780365879" ;
   schema:isbn "9780780365872" ;
    .

<http://worldcat.org/isbn/9780780365889>
    a schema:ProductModel ;
   schema:isbn "0780365887" ;
   schema:isbn "9780780365889" ;
    .

<http://worldcat.org/isbn/9780780365896>
    a schema:ProductModel ;
   schema:isbn "0780365895" ;
   schema:isbn "9780780365896" ;
    .

<http://www.worldcat.org/title/-/oclc/47050962>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/47050962> ; # 2001 IEEE International Reliability Physics Symposium : proceedings : 39th annual : Orlando, Florida, April 30-May 3, 2001
   schema:dateModified "2017-12-23" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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