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2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 24-26 October, 2001, San Francisco, California

Author: IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee.
Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, ©2001.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
Summary:

This volume features the proceedings of the International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001).

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Details

Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee.
ISBN: 0769512038 9780769512037 0769512046 9780769512044 0769512054 9780769512051
OCLC Number: 48385984
Notes: "IEEE Computer Society Order Number PR01203"--Title page verso.
Description: xiii, 468 pages : illustrations ; 23 cm
Other Titles: International Symposium on Defect and Fault Tolerance in VLSI Systems
Defect and fault tolerance in VLSI systems
DFT 2001
Responsibility: sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee.

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