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2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002

Author: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: [Piscataway, N.J.] : Electron Devices Society : Reliability Society, ©2002.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
International Integrated Reliability Workshop (2002 : Stanford Sierra Camp).
2002 IEEE International Integrated Reliability Workshop.
[Piscataway, N.J.] : Electron Devices Society : Reliability Society, ©2002
(DLC) 2002106802
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
ISBN: 0780375580 9780780375581
OCLC Number: 52149490
Notes: "IEEE Catalog No. 02TH8634."
Description: 1 online resource (v, 214 pages) : illustrations
Other Titles: Integrated Reliability Workshop Final Report, 2002. IEEE International.
Responsibility: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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