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2005 IEEE International Reliability Physics Symposium proceedings : 43rd annual : San Jose, California, April 17-21, 2005

Author: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: Piscataway, NJ : Institute of Electrical and Electronics Engineers, ©2005.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
ISBN: 0780388038 9780780388031
OCLC Number: 61267330
Description: 1 online resource (xii, 764 pages) : illustrations
Other Titles: Reliability Physics Symposium, 2005, proceedings, 43rd annual, 2005 IEEE International.
IEEE International Reliability Physics Symposium proceedings
Responsibility: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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Primary Entity

<http://www.worldcat.org/oclc/61267330> # 2005 IEEE International Reliability Physics Symposium proceedings : 43rd annual : San Jose, California, April 17-21, 2005
    a schema:Book, schema:MediaObject, schema:CreativeWork ;
   library:oclcnum "61267330" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nju> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1152570849#Place/piscataway_nj> ; # Piscataway, NJ
   rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/1152570849#CreativeWork/reliability_physics_symposium_2005_proceedings_43rd_annual_2005_ieee_international> ; # Reliability Physics Symposium, 2005, proceedings, 43rd annual, 2005 IEEE International.
   schema:about <http://experiment.worldcat.org/entity/work/data/1152570849#Topic/semiconductors_reliability> ; # Semiconductors--Reliability
   schema:about <http://id.worldcat.org/fast/1112249> ; # Semiconductors--Reliability
   schema:about <http://id.worldcat.org/fast/906827> ; # Electronic apparatus and appliances--Reliability
   schema:about <http://id.worldcat.org/fast/975588> ; # Integrated circuits--Reliability
   schema:about <http://experiment.worldcat.org/entity/work/data/1152570849#Topic/integrated_circuits_reliability> ; # Integrated circuits--Reliability
   schema:about <http://experiment.worldcat.org/entity/work/data/1152570849#Topic/electronic_apparatus_and_appliances_reliability> ; # Electronic apparatus and appliances--Reliability
   schema:alternateName "IEEE International Reliability Physics Symposium proceedings" ;
   schema:bookFormat schema:EBook ;
   schema:contributor <http://viaf.org/viaf/132537053> ; # IEEE Reliability Society.
   schema:contributor <http://viaf.org/viaf/169402490> ; # IEEE Electron Devices Society.
   schema:copyrightYear "2005" ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/1152570849#Meeting/international_reliability_physics_symposium_43rd_2005_san_jose_calif> ; # International Reliability Physics Symposium (43rd : 2005 : San Jose, Calif.)
   schema:datePublished "2005" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/1152570849> ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:genre "Conference publication"@en ;
   schema:inLanguage "en" ;
   schema:name "2005 IEEE International Reliability Physics Symposium proceedings : 43rd annual : San Jose, California, April 17-21, 2005"@en ;
   schema:productID "61267330" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/61267330#PublicationEvent/piscataway_nj_institute_of_electrical_and_electronics_engineers_2005> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/1152570849#Agent/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=9994> ;
   schema:workExample <http://worldcat.org/isbn/9780780388031> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/61267330> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1152570849#Agent/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers
    a bgn:Agent ;
   schema:name "Institute of Electrical and Electronics Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/1152570849#CreativeWork/reliability_physics_symposium_2005_proceedings_43rd_annual_2005_ieee_international> # Reliability Physics Symposium, 2005, proceedings, 43rd annual, 2005 IEEE International.
    a schema:CreativeWork ;
   schema:name "Reliability Physics Symposium, 2005, proceedings, 43rd annual, 2005 IEEE International." ;
    .

<http://experiment.worldcat.org/entity/work/data/1152570849#Meeting/international_reliability_physics_symposium_43rd_2005_san_jose_calif> # International Reliability Physics Symposium (43rd : 2005 : San Jose, Calif.)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/1152570849#Place/san_jose_calif> ; # San Jose, Calif.)
   schema:name "International Reliability Physics Symposium (43rd : 2005 : San Jose, Calif.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/1152570849#Place/san_jose_calif> # San Jose, Calif.)
    a schema:Place ;
   schema:name "San Jose, Calif.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/1152570849#Topic/electronic_apparatus_and_appliances_reliability> # Electronic apparatus and appliances--Reliability
    a schema:Intangible ;
   rdfs:seeAlso <http://id.loc.gov/authorities/subjects/sh2009124791> ;
   schema:name "Electronic apparatus and appliances--Reliability"@en ;
    .

<http://id.worldcat.org/fast/1112249> # Semiconductors--Reliability
    a schema:Intangible ;
   schema:name "Semiconductors--Reliability"@en ;
    .

<http://id.worldcat.org/fast/906827> # Electronic apparatus and appliances--Reliability
    a schema:Intangible ;
   schema:name "Electronic apparatus and appliances--Reliability"@en ;
    .

<http://id.worldcat.org/fast/975588> # Integrated circuits--Reliability
    a schema:Intangible ;
   schema:name "Integrated circuits--Reliability"@en ;
    .

<http://viaf.org/viaf/132537053> # IEEE Reliability Society.
    a schema:Organization ;
   schema:name "IEEE Reliability Society." ;
    .

<http://viaf.org/viaf/169402490> # IEEE Electron Devices Society.
    a schema:Organization ;
   schema:name "IEEE Electron Devices Society." ;
    .

<http://worldcat.org/isbn/9780780388031>
    a schema:ProductModel ;
   schema:isbn "0780388038" ;
   schema:isbn "9780780388031" ;
    .

<http://www.worldcat.org/title/-/oclc/61267330>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/61267330> ; # 2005 IEEE International Reliability Physics Symposium proceedings : 43rd annual : San Jose, California, April 17-21, 2005
   schema:dateModified "2016-05-10" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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