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2006 ROCS Workshop : proceedings : November 12, 2006, San Antonio, Texas

Author: JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.; IEEE Electron Devices Society.
Publisher: Arlington, Va. : JEDEC ; Piscataway, N.J. : IEEE, [2006]
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Electronic books
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.; IEEE Electron Devices Society.
ISBN: 0790801132 9780790801131
OCLC Number: 126853494
Language Note: English.
Notes: Title from summary screen (viewed May 11, 2007).
"IEEE Catalog Number: 06TH8929"--Copyright pdf.
"ROCS Workshop (formerly the GaAs REL Workshop)."
Description: 1 online resource
Other Titles: ROCS Workshop, 2006. Reliability of Compound Semiconductors
GaAs REL Workshop
Responsibility: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.

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