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2007 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers : April 25-27, 2007, Ambassador Hotel, Hsinchu, Taiwan

Author: Gong ye ji shu yan jiu yuan.; Institute of Electrical and Electronics Engineers.
Publisher: Piscataway, NJ : IEEE, ©2007.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
International Symposium on VLSI Design, Automation, and Test (2007 : Hsin-chu shih, Taiwan).
2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT).
Hsinchu, Taiwan : ITRI ; Piscataway, N.J. : IEEE, ©2007
(DLC) 2006931084
(OCoLC)244354485
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Gong ye ji shu yan jiu yuan.; Institute of Electrical and Electronics Engineers.
OCLC Number: 163584141
Notes: "IEEE catalog number: 07TH8910."
Description: 1 online resource (286, iii pages) : illustrations
Other Titles: VLSI-DAT
VLSI Design, Automation and Test, 2007, VLSI-DAT 2007, International Symposium on
Responsibility: Industrial Technology Research Institute, IEEE.

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