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2008 Biometrics Symposium (BSYM) : Tampa, Florida, 23-25 September 2008.

Publisher: [Piscataway, N.J.] : IEEE Xplore, ©2008.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Electronic books
Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
ISBN: 9781424425679 1424425670 9781424425662 1424425662
OCLC Number: 276956105
Notes: Title from PDF title page (viewed Dec. 3, 2008).
Description: 1 online resource
Other Titles: Biometrics Symposium, 2008, BSYM '08
BSYM '08

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