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2008 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 12-16, 2008

Author: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: [Piscataway, N.J.?] : Electron Devices Society : Reliability Society, ©2008.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Electronic books
Congresses
Additional Physical Format: CD-ROM version:
2008 IEEE International Integrated Reliability Workshop (Irw).
IEEE 2009
(OCoLC)441187771
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
OCLC Number: 496175991
Notes: Title from PDF title page (IEEE Xplore, viewed Jan. 6, 2010).
IEEE catalog no: CFP08IRW.
Description: 1 online resource : illustrations
Other Titles: IRW 2008 final report CD
Integrated Reliability Workshop Final Report, 2008, IRW 2008, IEEE International
IEEE International Integrated Reliability Workshop Final Report, 2008
Responsibility: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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