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2009 ROCS Workshop : proceedings : October 11, 2009, Greensboro, North Carolina

Author: JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.; IEEE Electron Devices Society.
Publisher: Piscataway, NJ : IEEE : Arlington, VA : JEDEC, [2009]
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Electronic books
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.; IEEE Electron Devices Society.
OCLC Number: 541088268
Notes: Title from PDF title page (viewed Sept. 15, 2009).
"IEEE Catalog number: CFP09GRW-ART"--PDF copyright page.
"Formerly the GaAs REL Workshop"--PDF cover.
Description: 1 online resource (viii, 146 pages) : illustrations (some color)
Other Titles: 2009 Reliability of Compound Semiconductors Workshop
2009 JEDEC ROCS Workshop
Reliability of Compound Semiconductors Digest (ROCS), 2009
ROCS 2009
Responsibility: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.

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