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2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Publisher: Piscataway : IEEE July 2011.
Edition/Format:   eBook : Document : EnglishView all editions and formats
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Genre/Form: Electronic books
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
ISBN: 9781457701597 1457701596
OCLC Number: 812660069
Language Note: English.
Target Audience: Scholarly & Professional
Description: 1 online resource

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