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2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT 2013) : Hsinchu, Taiwan, 22-24 April 2013.

Author: Institute of Electrical and Electronics Engineers.
Publisher: Piscataway, NJ : IEEE, ©2013.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Institute of Electrical and Electronics Engineers.
OCLC Number: 861074191
Notes: "CFP13847-POD."
Description: 1 online resource : illustrations
Other Titles: VLSI Design, Automation, and Test (VLSI-DAT), 2013 International Symposium on
213 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT)
VLSI-DAT 2013
International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

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