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2015 IEEE 24th Asian Test Symposium (ATS).

Publisher: [S.l.] : IEEE, 2015.
Edition/Format:   eBook : Document
Summary:
ATS is recognized as the main event in Asia that covers the many dimensions of testing and fault tolerance The symposium focuses on the key test challenge will arise due to the ability to design complex systems such as robots that encompass sensors, communication systems, processors, transducers and enabling software In addition to passing post manufacture test procedures, such systems and relevant devices must  Read more...
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Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
ISBN: 9781467397407 1467397407
OCLC Number: 972609696
Notes: Title from content provider.
Description: 1 online resource.

Abstract:

ATS is recognized as the main event in Asia that covers the many dimensions of testing and fault tolerance The symposium focuses on the key test challenge will arise due to the ability to design complex systems such as robots that encompass sensors, communication systems, processors, transducers and enabling software In addition to passing post manufacture test procedures, such systems and relevant devices must exhibit fault tolerance and survivability characteristics.

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