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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/213031064 Title: 20th IEEE VLSI Test Symposium (VTS 2002) : proceedings, 28 April - 2 May 2002, Monterey, California Publisher: Los Alamitos : IEEE Computer Society, ©2002. OCLC:213031064

  
  

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Subjects

• Circuits intégrés à grande échelle -- Essais -- Congrès.
• Circuit intégré à très grande échelle.
• Test de circuits intégrés.
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20th IEEE VLSI Test Symposium (VTS 2002) : proceedings, 28 April - 2 May 2002, Monterey, California

Author:	IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers.
Publisher:	Los Alamitos : IEEE Computer Society, ©2002.
Edition/Format:	eBook : Document : Conference publication : English
Rating:	(not yet rated) 0 with reviews - Be the first.