skip to content
31st Applied Imagery Pattern Recognition Workshop : proceedings : Washington, DC : October 16-18, 2002 Preview this item
ClosePreview this item
Checking...

31st Applied Imagery Pattern Recognition Workshop : proceedings : Washington, DC : October 16-18, 2002

Author: David Schaefer; IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.
Publisher: Los Alamitos, Calif. : IEEE Computer Society, 2002.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
AIPR Workshop (31st : 2002 : Washington, D.C.).
31st Applied Imagery Pattern Recognition Workshop.
Los Alamitos, Calif. : IEEE Computer Society, 2002
(DLC) 2002116640
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: David Schaefer; IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.
ISBN: 076951863X 9780769518633
OCLC Number: 52084521
Notes: "IEEE Computer Society Order Number PR01863"--Title page verso.
Description: 1 online resource (xi, 205 pages) : illustrations (some color)
Other Titles: Applied Imagery Pattern Recognition Workshop, 2002. Proceedings. 31st.
From color to hyperspectral, advancements in spectral imagery exploitation
AIPR 2002
Responsibility: edited by David H. Schaefer ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/52084521> # 31st Applied Imagery Pattern Recognition Workshop : proceedings : Washington, DC : October 16-18, 2002
    a schema:Book, schema:MediaObject, schema:CreativeWork ;
   library:oclcnum "52084521" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/197874796#Place/los_alamitos_calif> ; # Los Alamitos, Calif.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/cau> ;
   rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/197874796#CreativeWork/applied_imagery_pattern_recognition_workshop_2002_proceedings_31st> ; # Applied Imagery Pattern Recognition Workshop, 2002. Proceedings. 31st.
   schema:about <http://id.worldcat.org/fast/1046784> ; # Optical pattern recognition
   schema:about <http://experiment.worldcat.org/entity/work/data/197874796#Topic/image_processing_digital_techniques> ; # Image processing--Digital techniques
   schema:about <http://id.worldcat.org/fast/1055266> ; # Pattern recognition systems
   schema:about <http://id.worldcat.org/fast/967508> ; # Image processing--Digital techniques
   schema:about <http://experiment.worldcat.org/entity/work/data/197874796#Topic/pattern_recognition_systems> ; # Pattern recognition systems
   schema:about <http://experiment.worldcat.org/entity/work/data/197874796#Topic/optical_pattern_recognition> ; # Optical pattern recognition
   schema:alternateName "From color to hyperspectral, advancements in spectral imagery exploitation" ;
   schema:alternateName "AIPR 2002" ;
   schema:bookFormat schema:EBook ;
   schema:contributor <http://viaf.org/viaf/271183850> ; # David Schaefer
   schema:contributor <http://viaf.org/viaf/265224835> ; # IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.
   schema:creator <http://experiment.worldcat.org/entity/work/data/197874796#Meeting/applied_imagery_pattern_recognition_workshop_31st_2002_washington_d_c> ; # Applied Imagery Pattern Recognition Workshop (31st : 2002 : Washington, D.C.)
   schema:datePublished "2002" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/197874796> ;
   schema:genre "Conference publication"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://worldcat.org/entity/work/data/197874796#CreativeWork/31st_applied_imagery_pattern_recognition_workshop> ;
   schema:name "31st Applied Imagery Pattern Recognition Workshop : proceedings : Washington, DC : October 16-18, 2002"@en ;
   schema:productID "52084521" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/52084521#PublicationEvent/los_alamitos_calif_ieee_computer_society_2002> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/197874796#Agent/ieee_computer_society> ; # IEEE Computer Society
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=8428> ;
   schema:url <http://ezproxy.uis.edu:2048/login?url=http://ieeexplore.ieee.org/servlet/opac?punumber=8428> ;
   schema:url <https://proxy.library.carleton.ca/login?url=https://ieeexplore.ieee.org/servlet/opac?punumber=8428> ;
   schema:url <https://ieeexplore.ieee.org/servlet/opac?punumber=8428> ;
   schema:workExample <http://worldcat.org/isbn/9780769518633> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/52084521> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/197874796#Agent/ieee_computer_society> # IEEE Computer Society
    a bgn:Agent ;
   schema:name "IEEE Computer Society" ;
    .

<http://experiment.worldcat.org/entity/work/data/197874796#CreativeWork/applied_imagery_pattern_recognition_workshop_2002_proceedings_31st> # Applied Imagery Pattern Recognition Workshop, 2002. Proceedings. 31st.
    a schema:CreativeWork ;
   schema:name "Applied Imagery Pattern Recognition Workshop, 2002. Proceedings. 31st." ;
    .

<http://experiment.worldcat.org/entity/work/data/197874796#Meeting/applied_imagery_pattern_recognition_workshop_31st_2002_washington_d_c> # Applied Imagery Pattern Recognition Workshop (31st : 2002 : Washington, D.C.)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/197874796#Place/washington_d_c> ; # Washington, D.C.)
   schema:name "Applied Imagery Pattern Recognition Workshop (31st : 2002 : Washington, D.C.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/197874796#Place/los_alamitos_calif> # Los Alamitos, Calif.
    a schema:Place ;
   schema:name "Los Alamitos, Calif." ;
    .

<http://experiment.worldcat.org/entity/work/data/197874796#Place/washington_d_c> # Washington, D.C.)
    a schema:Place ;
   schema:name "Washington, D.C.)" ;
    .

<http://id.worldcat.org/fast/1046784> # Optical pattern recognition
    a schema:Intangible ;
   schema:name "Optical pattern recognition"@en ;
    .

<http://id.worldcat.org/fast/1055266> # Pattern recognition systems
    a schema:Intangible ;
   schema:name "Pattern recognition systems"@en ;
    .

<http://id.worldcat.org/fast/967508> # Image processing--Digital techniques
    a schema:Intangible ;
   schema:name "Image processing--Digital techniques"@en ;
    .

<http://viaf.org/viaf/265224835> # IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.
    a schema:Organization ;
   schema:name "IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence." ;
    .

<http://viaf.org/viaf/271183850> # David Schaefer
    a schema:Person ;
   schema:familyName "Schaefer" ;
   schema:givenName "David" ;
   schema:name "David Schaefer" ;
    .

<http://worldcat.org/entity/work/data/197874796#CreativeWork/31st_applied_imagery_pattern_recognition_workshop>
    a schema:CreativeWork ;
   rdfs:label "31st Applied Imagery Pattern Recognition Workshop." ;
   schema:description "Print version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/52084521> ; # 31st Applied Imagery Pattern Recognition Workshop : proceedings : Washington, DC : October 16-18, 2002
    .

<http://worldcat.org/isbn/9780769518633>
    a schema:ProductModel ;
   schema:isbn "076951863X" ;
   schema:isbn "9780769518633" ;
    .

<http://www.worldcat.org/title/-/oclc/52084521>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/52084521> ; # 31st Applied Imagery Pattern Recognition Workshop : proceedings : Washington, DC : October 16-18, 2002
   schema:dateModified "2018-11-10" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .

<https://ieeexplore.ieee.org/servlet/opac?punumber=8428>
   rdfs:comment "E-book - Full text from IEEE Xplore (Please do not use Internet Explorer) (available on site only; if working off-site please use MetCat)" ;
    .

<https://proxy.library.carleton.ca/login?url=https://ieeexplore.ieee.org/servlet/opac?punumber=8428>
   rdfs:comment "IEEE Xplore (Access restricted to 50 simultaneous users)" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.