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Acoustic scanning probe microscopy

Author: Francesco Marinello; Daniele Passeri; Enrico Savio
Publisher: Berlin ; New York : Springer, ©2013.
Series: Nanoscience and technology.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Francesco Marinello; Daniele Passeri; Enrico Savio
ISBN: 9783642274947 3642274943
OCLC Number: 813838370
Description: 1 online resource.
Contents: Acoustic Scanning Probe Microscopy: An Overview / D. Passeri and F. Marinello --
Contact, Interactions, and Dynamics / E. Barthel --
Cantilever Dynamics: Theoretical Modeling / John H. Cantrell and Sean A. Cantrell --
One-Dimensional Finite Element Modeling of AFM Cantilevers / Richard Arinero and Gérard Lévêque --
Atomic Force Acoustic Microscopy / U. Rabe, M. Kopycinska-Müller and S. Hirsekorn --
Ultrasonic Atomic Force Microscopy UAFM / Kazushi Yamanaka and Toshihiro Tsuji --
Enhanced Sensitivity of AFAM and UAFM by Concentrated-Mass Cantilevers / Mikio Muraoka --
Scanning Microdeformation Microscopy: Advances in Quantitative Micro- and Nanometrology / P. Vairac, J. Le Rouzic, P. Delobelle and B. Cretin --
Ultrasonic Force Microscopies / Oleg Kolosov and Andrew Briggs --
Scanning Near-Field Ultrasound Holography / Shraddha Avasthy, Gajendra S. Shekhawat and Vinayak P. Dravid --
Mapping of the Surface's Mechanical Properties Through Analysis of Torsional Cantilever Bending in Dynamic Force Microscopy / Andrzej Sikora and Łukasz Bednarz --
Quantitative Measurements of Elastic Properties with Ultrasonic-Based AFM and Conventional Techniques / D.C. Hurley --
Data Processing for Acoustic Probe Microscopy Techniques / F. Marinello, D. Passeri, P. Schiavuta and E. Savio --
Friction and Internal Friction Measurements by Atomic Force Acoustic Microscopy / A. Caron and W. Arnold --
Quantitative Subsurface Imaging by Acoustic AFM Techniques / Zehra Parlak and Levent F. Degertekin --
Polymer Material Characterization by Acoustic Force Microscopy / Chad S. Korach --
Application of Acoustic Techniques for Characterization of Biological Samples / Bernhard R. Tittmann and Anne Ebert.
Series Title: Nanoscience and technology.
Responsibility: Francesco Marinello, Daniele Passeri, Enrico Savio, editors.

Abstract:

This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages  Read more...

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