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Advanced microwave and millimeter-wave detectors : 25-26 July 1994, San Diego, California

Author: Satish S Udpa; Hsiu C Han; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1994.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 2275.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
Advanced microwave and millimeter-wave detectors.
Bellingham, Wash., USA : SPIE, ©1994
(OCoLC)624472291
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Satish S Udpa; Hsiu C Han; Society of Photo-optical Instrumentation Engineers.
ISBN: 0819415995 9780819415998
OCLC Number: 31209759
Description: ix, 310 pages : illustrations ; 28 cm.
Contents: Nondestructive evaluation using microwaves and millimeter waves --
Microwave imaging and ground-penetrating radar --
Recent advances and emerging technologies : high-resolution metrology and advanced detection techniques.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 2275.
Responsibility: Satish S. Udpa, Hsiu C. Han, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

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