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Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Author: Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
Publisher: Boston, MA : Springer-Verlag US, 2010.
Edition/Format:   eBook : Document : English : 1View all editions and formats
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Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
ISBN: 9781441909381 1441909389
OCLC Number: 699651582
Description: 1 Online-Ressource
Responsibility: by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel.

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