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|Genre/Form:||Conference papers and proceedings
|Additional Physical Format:||Online version:
Symposium on Advances in Electron Metallography.
Advances in electron metallography
|Material Type:||Conference publication|
|Document Type:||Journal / Magazine / Newspaper|
|All Authors / Contributors:||Symposium on Advances in Electron Metallography.; American Society for Testing and Materials.; American Society for Testing Materials.; American Society for Testing and Materials. Committee E-4 on Metallography.; American Society for Testing Materials. Committee E-4 on Metallography.|
|Notes:||Added title, 1965- : ASTM advances in electron metallography series.
Vols. for 1960-61 issued in combined form.
Title varies: 1963, Techniques for electron microscopy, diffraction, and microprobe analysis.
Vols. for 1958-62 issued without title.
Published by the American Society for Testing and Materials (called 1958-59, American Society for Testing Materials).
Sponsored by the society's Committee E-4 on Electron Metallography (called 1958-59, 1963- Committee on E-4 on Metallography).
Vols. for 1959-63 issued under the symposium's variant names: 1959, 1963, Symposium on Electron Metallography; 1960-61, Symposium on Advances in Electron Metallography and Electron Probe Microanalysis; 1962, Symposium on Advances in Techniques in Electron Metallography.
|Description:||v. ill. 24 cm.|
|Series Title:||American Society for Testing Materials.; Special technical publication; American Society for Testing and Materials.; Special technical publication.; ASTM advances in electron metallography.|