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Advances in imaging and electron physics. Vol. 178

Author: P W Hawkes
Publisher: Amsterdam ; Boston : Academic Press, 2013.
Edition/Format:   eBook : Document : English
Database:WorldCat
Summary:
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: * Contributions from leading authorities * Informs  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Advances in imaging and electron physics. Volume 178
(OCoLC)843807635
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: P W Hawkes
ISBN: 9780124077294 0124077293
OCLC Number: 851522424
Description: 1 online resource
Contents: Front Cover; EDITOR-IN-CHIEF; ADVANCES IN IMAGING ANDELECTRON PHYSICS; COPYRIGHT; CONTENTS; PREFACE; FUTURE CONTRIBUTIONS; CONTRIBUTORS; Chapter One --
Generalized Axiomatic Scale-Space Theory; 1. INTRODUCTION; 2. IMAGE MEASUREMENTS AND THE NOTION OF SCALE; 3. STRUCTURAL ASSUMPTIONS OF SCALE-SPACE THEORY; 4. SCALE-SPACE AXIOMS FOR SPATIAL IMAGE DOMAINS; 5. SCALE-SPACE CONCEPTS FOR SPATIAL IMAGE DOMAINS; 6. SCALE-SPACE AXIOMS FOR SPATIOTEMPORAL IMAGE DOMAINS; 7. SCALE-SPACE CONCEPTS FOR SPATIOTEMPORAL IMAGE DOMAINS; 8. TEMPORAL SMOOTHING KERNELS; 9. HISTORY OF AXIOMATIC SCALE-SPACE FORMULATIONS. 10. SUMMARY AND CONCLUSIONSACKNOWLEDGMENTS; REFERENCES; Chapter Two --
Smoothlet Transform: Theory and Applications; 1. INTRODUCTION; 2. SMOOTHLETS; 3. SMOOTHLET TRANSFORM; 4. IMAGE COMPRESSION; 5. IMAGE DENOISING; 6. SUMMARY; REFERENCES; Chapter Three- Theory and Computation of Electron Mirrors: The Central Particle Method; 1. INTRODUCTION; 2. SYSTEMS WITH A STRAIGHT OPTICAL AXIS; 3. AXIALLY SYMMETRIC CHARGED-PARTICLE OPTICAL SYSTEMS; 4. TIME-OF-FLIGHT MASS SPECTROMETER; 5. ELECTRON MICROSCOPE OBJECTIVE WITH AN ELECTRON MIRROR; 6. SUMMARY AND CONCLUSIONS; ACKNOWLEDGMENTS; REFERENCES; INDEX; Volume 1511. Volume 152Volume 153; Volume 154; Volume 155; Volume 156; Volume 157; Volume 158; Volume 159; Volume 160; Volume 161; Volume 162; Volume 163; Volume 164; Volume 165; Volume 166; Volume 167; Volume 168; Volume 169; Volume 170; Volume 171; Volume 172; Volume 173; Volume 174; Volume 175; Volume 176; Volume 177.
Responsibility: edited by Peter W. Hawkes.

Abstract:

Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing,  Read more...

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