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Advances in imaging and electron physics. Volume 179.

Author: Academic Press.
Publisher: Amsterdam : Academic Press, 2013.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Advances in imaging and electron physics. Volume 179
(OCoLC)852806073
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Academic Press.
ISBN: 9780124077287 0124077285
OCLC Number: 853548922
Description: 1 online resource
Contents: Invariant Quantum Wave Equations and Double Space-TimeClaude DaviauIn-Situ and Correlative Electron MicroscopyNiels de JongeElectron Tweezers as a Tool for High Precision Manipulation of NanoobjectsVladimir P. Oleshko and James M. HoweRobustness Analysis of the Reduced Fuzzy Texture Spectrum and its Performance on Noisy ImagesPilar Sobrevilla , Eduard Montseny, and Aina Barcelo Measure-by-Wire: An Automatic Control Framework for High-Throughput Transmission Electron MicroscopyArturo Tejada, Wouter Van den Broek, and Arnold J. den Dekker

Abstract:

Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing,  Read more...

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Primary Entity

<http://www.worldcat.org/oclc/853548922> # Advances in imaging and electron physics. Volume 179.
    a schema:Book, schema:CreativeWork, schema:MediaObject ;
   library:oclcnum "853548922" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/ne> ;
   schema:about <http://id.worldcat.org/fast/1046908> ; # Optoelectronic devices
   schema:about <http://experiment.worldcat.org/entity/work/data/3771764281#Topic/technology_&_engineering_imaging_systems> ; # TECHNOLOGY & ENGINEERING--Imaging Systems
   schema:about <http://id.worldcat.org/fast/1046675> ; # Optical data processing
   schema:about <http://dewey.info/class/621.367/e23/> ;
   schema:bookFormat schema:EBook ;
   schema:contributor <http://experiment.worldcat.org/entity/work/data/3771764281#Organization/academic_press> ; # Academic Press.
   schema:datePublished "2013" ;
   schema:description "Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/3771764281> ;
   schema:genre "Electronic books"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/852806073> ;
   schema:name "Advances in imaging and electron physics. Volume 179."@en ;
   schema:productID "853548922" ;
   schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=610998> ;
   schema:url <http://www.sciencedirect.com/science/book/9780124077003> ;
   schema:workExample <http://worldcat.org/isbn/9780124077287> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/853548922> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/3771764281#Topic/technology_&_engineering_imaging_systems> # TECHNOLOGY & ENGINEERING--Imaging Systems
    a schema:Intangible ;
   schema:name "TECHNOLOGY & ENGINEERING--Imaging Systems"@en ;
    .

<http://id.worldcat.org/fast/1046675> # Optical data processing
    a schema:Intangible ;
   schema:name "Optical data processing"@en ;
    .

<http://id.worldcat.org/fast/1046908> # Optoelectronic devices
    a schema:Intangible ;
   schema:name "Optoelectronic devices"@en ;
    .

<http://worldcat.org/isbn/9780124077287>
    a schema:ProductModel ;
   schema:isbn "0124077285" ;
   schema:isbn "9780124077287" ;
    .

<http://www.worldcat.org/oclc/852806073>
    a schema:CreativeWork ;
   rdfs:label "Advances in imaging and electron physics. Volume 179" ;
   schema:description "Print version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/853548922> ; # Advances in imaging and electron physics. Volume 179.
    .


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