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Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA

Author: Lahsen Assoufid; Peter Z Takacs; Masaru Ohtsuka; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash. : SPIE, 200.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 6704.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Lahsen Assoufid; Peter Z Takacs; Masaru Ohtsuka; Society of Photo-optical Instrumentation Engineers.
ISBN: 9780819468529 0819468525
OCLC Number: 174030459
Notes: Title from PDF title page (viewed on Oct. 4, 2007).
Description: 1 volume (various pagings) : digital, PDF file.
Details: Mode of access: World Wide Web.
Contents: Suppressing vibration errors in phase-shifting interferometry / Leslie L. Deck --
High order harmonics wavefront measurement and optimization / J. Gautier [and others] --
Hard x-ray wavefront measurement and control for hard x-ray nanofocusing / Soichiro Handa [and others] --
Microstitching interferometer and relative angle determinable stitching interferometer for half-meter-long x-ray mirror / Haruhiko Ohashi [and others] --
A microstitching interferometer for evaluating the surface profile of precisely figured x-ray K-B mirrors / Lahsen Assoufid [and others] --
Optimized use and calibration of autocollimators in deflectometry / Ralf D. Geckeler and Andreas Just --
Binary pseudo-random grating as a standard test surface for measurement of modulation transfer function of interferometric microscopes / Valeriy V. Yashchuk, Wayne R. McKinney, and Peter Z. Takacs --
Precision tiltmeter as a reference for slope measuring instruments / Jonathan L. Kirschman [and others] --
Proposal for a universal test mirror for characterization of slope measuring instruments / Valeriy V. Yashchuk [and others] --
Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors / A. Rommeveaux [and others] --
Comparison of slope and height profiles for flat synchrotron x-ray mirrors measured with a long trace profiler and a PMI Fizeau interferometer / Jun Qian, Lahsen Assoufid, and Albert Macrander --
Surface gradient integrated profiler for x-ray and EUV optics: self calibration method of measured position for an off-axis parabolic mirror (f=150mm) measurement / Y. Higashi [and others] --
Progress in the x-ray optics and metrology lab at Diamond Light Source / Simon G. Alcock and K.J.S. Sawhney --
Recent developments on the Daresbury Laboratory long trace profiler / A. Gleeson --
New procedures for the adjustment of elliptically bent mirrors with the long trace profiler / Wayne R. McKinney [and others] --
Systematic error reduction: non-tilted reference beam method for long trace profiler / Shinan Qian [and others] --
Flat-field calibration of CCD detector for long trace profiler / Jonathan L. Kirschman [and others].
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 6704.
Other Titles: SPIE digital library.
Responsibility: Lahsen Assoufid, Peter Z. Takacs, Masaru Ohtsuka, editors ; sponsored and published by SPIE.

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