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Advances in transducers, equipment and data processing to improve the reliability of NDT : Tuesday, 4 December 1990

Author: Institution of Electrical Engineers. Science, Education, and Management Division.; Institution of Electrical Engineers. Professional Group S6 (Non-destructive Testing)
Publisher: London : Institution of Electrical Engineers, 1990.
Series: Colloquium (Institution of Electrical Engineers), no. 90/172.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Advances in transducers, equipment and data processing to improve the reliability of NDT.
London : Institution of Electrical Engineers, 1990
(OCoLC)35507260
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Institution of Electrical Engineers. Science, Education, and Management Division.; Institution of Electrical Engineers. Professional Group S6 (Non-destructive Testing)
OCLC Number: 47882032
Notes: At head of title: Science Education and Technology Division.
Description: 1 online resource (1 volume (various pagings)).
Series Title: Colloquium (Institution of Electrical Engineers), no. 90/172.
Responsibility: organised by Professional Group S6 (Non-destructive Testing).

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