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Analysis and comparison of various image downsampling and unsampling methods

Author: Abdou S Youssef; National Institute of Standards and Technology (U.S.)
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
Series: NISTIR, 6155.
Edition/Format:   Book   Microform : National government publication : Microfiche : EnglishView all editions and formats
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Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: Abdou S Youssef; National Institute of Standards and Technology (U.S.)
OCLC Number: 41205290
Notes: Shipping list no.: 99-0334-M.
"December 1998."
Reproduction Notes: Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1999]. 1 microfiche : negative.
Description: 8, [8] pages : illustrations.
Series Title: NISTIR, 6155.
Responsibility: Abdou Youssef.

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